<abstract xmlns="http://www.w3.org/1999/xhtml"><p>The paper presents a new functional test generation method for processors testing based on genetic algorithms and evolutionary strategies. The tests are generated over an instruction set architecture and a processor description. Such functional tests belong to the software-oriented testing. Quality of the tests is evaluated by code coverage of the processor description using simulation. The presented test generation method uses VHDL models of processors and the professional simulator ModelSim. The rules, parameters and fitness functions were defined for various genetic algorithms used in automatic test generation. Functionality and effectiveness were evaluated using the RISC type processor DP32.</p></abstract>

The paper presents a new functional test generation method for processors testing based on genetic algorithms and evolutionary strategies. The tests are generated over an instruction set architecture and a processor description. Such functional tests belong to the software-oriented testing. Quality of the tests is evaluated by code coverage of the processor description using simulation. The presented test generation method uses VHDL models of processors and the professional simulator ModelSim. The rules, parameters and fitness functions were defined for various genetic algorithms used in automatic test generation. Functionality and effectiveness were evaluated using the RISC type processor DP32.

An Efficient Functional Test Generation Method For Processors Using Genetic Algorithms

Faculty of Informatics and Information Technologies of the Slovak University of Technology Ilkovičova 2, 842 16 Bratislava, Slovakia

Journal of Electrical Engineering

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

The paper presents a new functional test generation method for processors testing based on genetic algorithms and evolutionary strategies. The tests are...

An Efficient Functional Test Generation Method For Processors Using Genetic Algorithms

Published Online: Sep 19, 2015

Page range: 185 - 193

Received: Sep 16, 2014

DOI: https://doi.org/10.2478/jee-2015-0031

Keywords
processor, testing, functional test, test generation, genetic algorithm, evolutionary strategy

© Faculty of Electrical Engineering and Information Technology, Slovak University of Technology

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

An Efficient Functional Test Generation Method For Processors Using Genetic Algorithms

Published Online: Sep 19, 2015

Page range: 185 - 193

Received: Sep 16, 2014

DOI: https://doi.org/10.2478/jee-2015-0031

Keywordsprocessor, testing, functional test, test generation, genetic algorithm, evolutionary strategy

© Faculty of Electrical Engineering and Information Technology, Slovak University of Technology

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

Keywords
processor, testing, functional test, test generation, genetic algorithm, evolutionary strategy