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Journal of Electrical Engineering
Volume 66 (2015): Issue 4 (July 2015)
Open Access
An Efficient Functional Test Generation Method For Processors Using Genetic Algorithms
Ján Hudec
Ján Hudec
and
Elena Gramatová
Elena Gramatová
| Sep 19, 2015
Journal of Electrical Engineering
Volume 66 (2015): Issue 4 (July 2015)
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Published Online:
Sep 19, 2015
Page range:
185 - 193
Received:
Sep 16, 2014
DOI:
https://doi.org/10.2478/jee-2015-0031
Keywords
processor
,
testing
,
functional test
,
test generation
,
genetic algorithm
,
evolutionary strategy
© Faculty of Electrical Engineering and Information Technology, Slovak University of Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.