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Materials Science-Poland
Volume 34 (2016): Issue 4 (December 2016)
Open Access
Optical spectroscopic analysis of annealed Cd
1−x
Zn
x
Se thin films deposited by close space sublimation technique
Ijaz Ali
Ijaz Ali
,
Amjid Iqbal
Amjid Iqbal
,
Arshad Mahmood
Arshad Mahmood
,
A. Shah
A. Shah
,
M. Zakria
M. Zakria
and
Asad Ali
Asad Ali
| Dec 19, 2016
Materials Science-Poland
Volume 34 (2016): Issue 4 (December 2016)
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Published Online:
Dec 19, 2016
Page range:
828 - 833
Received:
Apr 16, 2016
Accepted:
Oct 17, 2016
DOI:
https://doi.org/10.1515/msp-2016-0118
Keywords
thin films
,
optical constants
,
ellipsometry
,
CdZnSe
,
optical band gap
© Wroclaw University of Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.