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Materials Science-Poland
Volume 34 (2016): Issue 4 (December 2016)
Open Access
Optical spectroscopic analysis of annealed Cd
1−x
Zn
x
Se thin films deposited by close space sublimation technique
Ijaz Ali
Ijaz Ali
,
Amjid Iqbal
Amjid Iqbal
,
Arshad Mahmood
Arshad Mahmood
,
A. Shah
A. Shah
,
M. Zakria
M. Zakria
and
Asad Ali
Asad Ali
| Dec 19, 2016
Materials Science-Poland
Volume 34 (2016): Issue 4 (December 2016)
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Published Online:
Dec 19, 2016
Page range:
828 - 833
Received:
Apr 16, 2016
Accepted:
Oct 17, 2016
DOI:
https://doi.org/10.1515/msp-2016-0118
Keywords
thin films
,
optical constants
,
ellipsometry
,
CdZnSe
,
optical band gap
© Wroclaw University of Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.
Ijaz Ali
Department of Physics, Pakistan Institute of Engineering and Applied Science (PIEAS), Islamabad
Pakistan
Amjid Iqbal
National Institute of Lasers and Optronics (NILOP), Islamabad,
Pakistan
Arshad Mahmood
National Institute of Lasers and Optronics (NILOP), Islamabad,
Pakistan
A. Shah
National Institute of Lasers and Optronics (NILOP), Islamabad,
Pakistan
M. Zakria
National Institute of Lasers and Optronics (NILOP), Islamabad,
Pakistan
Asad Ali
Quality Assurance Division, Pakistan Institute of Nuclear Science and Technology, Islamabad,
Pakistan