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Measurement Science Review
Volume 16 (2016): Issue 4 (August 2016)
Open Access
Sensitivity Jump of Micro Accelerometer Induced by Micro-fabrication Defects of Micro Folded Beams
Wu Zhou
Wu Zhou
,
Lili Chen
Lili Chen
,
Huijun Yu
Huijun Yu
,
Bei Peng
Bei Peng
and
Yu Chen
Yu Chen
| Aug 19, 2016
Measurement Science Review
Volume 16 (2016): Issue 4 (August 2016)
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Published Online:
Aug 19, 2016
Page range:
228 - 234
Received:
Jan 03, 2016
Accepted:
Aug 10, 2016
DOI:
https://doi.org/10.1515/msr-2016-0028
Keywords
MEMS
,
micro accelerometer
,
stiffness
,
sensitivity
,
defect
© 2016 Wu Zhou et al., published by De Gruyter Open
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.
Wu Zhou
School of Mechatronics Engineering, University of Electronic Technology and Science of China, 2006 Xiyuan Ave., 611731, Chengdu, China
Lili Chen
College of Mechanical Engineering, Chengdu Technological University, 1 Zhongxing Ave., 611730, Chengdu, China
Huijun Yu
School of Mechatronics Engineering, University of Electronic Technology and Science of China, 2006 Xiyuan Ave., 611731, Chengdu, China
Bei Peng
School of Mechatronics Engineering, University of Electronic Technology and Science of China, 2006 Xiyuan Ave., 611731, Chengdu, China
Yu Chen
School of Mechatronics Engineering, University of Electronic Technology and Science of China, 2006 Xiyuan Ave., 611731, Chengdu, China