<abstract xmlns="http://www.w3.org/1999/xhtml">Cd1−xZnxSe (x = 0, 0.40 and 1) thin films were deposited on a glass substrate at room temperature by closed space sublimation method. Optical investigation has been performed using spectrophotometry and ellipsometry. It has been found that for as deposited films the optical band gap increased and the optical constants decreased with increasing Zn content. To improve the optical properties of Cd1−xZnxSe thin films annealing effect at 400 °C was taken into consideration for various Zn contents. It was observed that the optical transmittance and band gap decreased while optical constants increased with increasing Zn content after annealing. The effects of composition and annealing on the optical dispersion parameters Eo and Ed were investigated using a single effective oscillator model. The calculated value of the average excitation energy Eo obeys the empirical relation (Eo = Eg/2) obtained from the single oscillator model.</abstract>

Cd1−xZnxSe (x = 0, 0.40 and 1) thin films were deposited on a glass substrate at room temperature by closed space sublimation method. Optical investigation has been performed using spectrophotometry and ellipsometry. It has been found that for as deposited films the optical band gap increased and the optical constants decreased with increasing Zn content. To improve the optical properties of Cd1−xZnxSe thin films annealing effect at 400 °C was taken into consideration for various Zn contents. It was observed that the optical transmittance and band gap decreased while optical constants increased with increasing Zn content after annealing. The effects of composition and annealing on the optical dispersion parameters Eo and Ed were investigated using a single effective oscillator model. The calculated value of the average excitation energy Eo obeys the empirical relation (Eo = Eg/2) obtained from the single oscillator model.

Optical spectroscopic analysis of annealed Cd1−xZnxSe thin films deposited by close space sublimation technique

Department of Physics, Pakistan Institute of Engineering and Applied Science (PIEAS), Islamabad

National Institute of Lasers and Optronics (NILOP), Islamabad,

Quality Assurance Division, Pakistan Institute of Nuclear Science and Technology, Islamabad,

Materials Science-Poland

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

Optical spectroscopic analysis of annealed CdZnSe thin films deposited by close space sublimation technique

Cd1−xZnxSe (x = 0, 0.40 and 1) thin films were deposited on a glass substrate at room temperature by closed space sublimation method. Optical investigation has...

Composition	Eg (eV)	Eg (eV)	Eo (eV)	Eo (eV)	Ed (eV)	Ed (eV)	Thickness (nm)	Thickness (nm)
	as dep	annealed	as dep	annealed	annealed	annealed	as dep	annealed
CdSe	1.69	1.65	3.42	3.19	19.37	18.78	180	177
Cd:60Zn:40Se	2.1	2	4.07	3.96	20.87	20.88	158	154
ZnSe	2.57	2.5	4.85	4.58	22.67	22.47	190	179

Optical spectroscopic analysis of annealed Cd_1−xZn_xSe thin films deposited by close space sublimation technique

Pubblicato online: 19 dic 2016

Pagine: 828 - 833

Ricevuto: 16 apr 2016

Accettato: 17 ott 2016

DOI: https://doi.org/10.1515/msp-2016-0118

Parole chiave
thin films, optical constants, ellipsometry, CdZnSe, optical band gap

© Wroclaw University of Technology

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

Optical band gap and dispersion parameters for investigated thin films.

Optical spectroscopic analysis of annealed Cd1−xZnxSe thin films deposited by close space sublimation technique

Pubblicato online: 19 dic 2016

Pagine: 828 - 833

Ricevuto: 16 apr 2016

Accettato: 17 ott 2016

DOI: https://doi.org/10.1515/msp-2016-0118

Parole chiavethin films, optical constants, ellipsometry, CdZnSe, optical band gap

© Wroclaw University of Technology

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

Optical band gap and dispersion parameters for investigated thin films.

Optical spectroscopic analysis of annealed Cd_1−xZn_xSe thin films deposited by close space sublimation technique

Parole chiave
thin films, optical constants, ellipsometry, CdZnSe, optical band gap