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Local Detection Of Defects From Image Sequences

International Journal of Applied Mathematics and Computer Science's Cover Image
International Journal of Applied Mathematics and Computer Science
Issues in Fault Diagnosis and Fault Tolerant Control (special issue), Józef Korbicz and Dominique Sauter (Eds.)

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ISSN:
1641-876X
Language:
English
Publication timeframe:
4 times per year
Journal Subjects:
Mathematics, Applied Mathematics