Login
Register
Reset Password
Publish & Distribute
Publishing Solutions
Distribution Solutions
Subjects
Publications
Journals
Books
Proceedings
Publishers
Blog
Contact
Search
Cart
EUR
USD
GBP
English
English
Deutsch
Polski
Español
Français
Italiano
Home
Journals
International Journal of Applied Mathematics and Computer Science
Volume 18 (2008): Issue 4 (December 2008)
Open Access
Local Detection Of Defects From Image Sequences
Ewaryst Rafajłowicz
Ewaryst Rafajłowicz
,
Marek Wnuk
Marek Wnuk
and
Wojciech Rafajłowicz
Wojciech Rafajłowicz
| Dec 30, 2008
International Journal of Applied Mathematics and Computer Science
Volume 18 (2008): Issue 4 (December 2008)
Issues in Fault Diagnosis and Fault Tolerant Control (special issue), Józef Korbicz and Dominique Sauter (Eds.)
About this article
Previous Article
Next Article
Abstract
References
Authors
Articles in this Issue
Preview
PDF
Cite
Share
Published Online:
Dec 30, 2008
Page range:
581 - 592
DOI:
https://doi.org/10.2478/v10006-008-0051-6
Keywords
image processing
,
fractal dimension
,
morphological operations
This content is open access.
Ewaryst Rafajłowicz
Institute of Computer Engineering, Control and Robotics, Wrocław University of Technology, Wybrzeże Wyspiańskiego 27, 50-370 Wrocław, Poland
Marek Wnuk
Institute of Computer Engineering, Control and Robotics, Wrocław University of Technology, Wybrzeże Wyspiańskiego 27, 50-370 Wrocław, Poland
Wojciech Rafajłowicz
Institute of Computer Engineering, Control and Robotics, Wrocław University of Technology, Wybrzeże Wyspiańskiego 27, 50-370 Wrocław, Poland