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Materials Science-Poland
Volume 32 (2014): Issue 4 (December 2014)
Open Access
Preparation and microstructural characterization of Si(100) Ce1−x GdxO2−δ thin films prepared by pulsed laser deposition technique
P. Nagaraju
P. Nagaraju
,
Y. Vijayakumar
Y. Vijayakumar
,
D. Phase
D. Phase
,
V. Reddy
V. Reddy
and
M. Ramana Reddy
M. Ramana Reddy
| Dec 19, 2014
Materials Science-Poland
Volume 32 (2014): Issue 4 (December 2014)
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Published Online:
Dec 19, 2014
Page range:
541 - 546
DOI:
https://doi.org/10.2478/s13536-014-0246-5
Keywords
cerium oxide
,
dislocation densities
,
gadolinium doped cerium oxide
,
microstructure
,
pulsed laser deposition
,
thin films
© 2014 Wroclaw University of Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.
P. Nagaraju
CMR Technical Campus, Hyderabad, India
Y. Vijayakumar
Department of Physics, Osmania University, Hyderabad, India
D. Phase
IUC, Indore, India
V. Reddy
IUC, Indore, India
M. Ramana Reddy
Department of Physics, Osmania University, Hyderabad, India