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Materials Science-Poland
Volume 32 (2014): Issue 4 (December 2014)
Open Access
Preparation and microstructural characterization of Si(100) Ce1−x GdxO2−δ thin films prepared by pulsed laser deposition technique
P. Nagaraju
P. Nagaraju
,
Y. Vijayakumar
Y. Vijayakumar
,
D. Phase
D. Phase
,
V. Reddy
V. Reddy
and
M. Ramana Reddy
M. Ramana Reddy
| Dec 19, 2014
Materials Science-Poland
Volume 32 (2014): Issue 4 (December 2014)
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Published Online:
Dec 19, 2014
Page range:
541 - 546
DOI:
https://doi.org/10.2478/s13536-014-0246-5
Keywords
cerium oxide
,
dislocation densities
,
gadolinium doped cerium oxide
,
microstructure
,
pulsed laser deposition
,
thin films
© 2014 Wroclaw University of Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.