A novel temperature controller for in-situ measurement of radiation-induced changes in temperature effects on space electronics
and | Jul 18, 2019
About this article
Published Online: Jul 18, 2019
Page range: 227 - 235
Received: Mar 02, 2019
DOI: https://doi.org/10.2478/jee-2019-0031
Keywords
© 2019 Jiri Haze et al., published by Sciendo
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.
The paper discusses a novel temperature controller and a related test method allowing in-situ measurement of total ionising dose-induced changes in the impact of temperature on electronic devices for space applications. Various results of pilot radiation experiments (testing commercial PMOS transistors, RADFETs, and voltage references) are also presented.