Application Of Carbon Nanotubes And Reduced Graphene Oxide Layers For Ohmic Contacts To p–GaN

[1] LEE, K.—WU, Z.—CHEN, Z.—REN, F.—PEARTON, S. J.— RINZLER, A. G. PEARTON: Single Wall Carbon Nanotubes for p-Type Ohmic Contacts to GaN Light-Emitting Diodes, Nanoletters 4 No. 5 (2004), 911–914.10.1021/nl0496522Search in Google Scholar

[2] LIDAY, J.—VOGRINČIČ, P.—VRETENÁR, V.—KOTLÁR, M.—MARTON, M.—ŘEHÁČEK, V. : Ohmic Contacts to p-GaN Based on the Single-Walled Carbon Nanotubes, Journal of Electrical Engineering 64 No. 5 (2013), 323–326.10.2478/jee-2013-0047Search in Google Scholar

[3] TUAN ANH PHAM—JEONG SIK KIM—JEONG SU KIM—YEON TAE JEONG: One-Step Reduction of Grephene Oxide with L-Glutathione Colloids and Surfaces A:, Physicochemical and Engineering Aspects 384 No. 1-3 (2011), 543–548.10.1016/j.colsurfa.2011.05.019Search in Google Scholar

[4] SKÁKALOVÁ, V.—VRETENÁR, V.—KOPERA,.—KOTRUSZ, P.—MANGLER, C.—MEŠKO, M.—MEYER, J. C.—HULMAN, M. : Electronic Transport in Composites of Graphite Oxide with Carbon Nanotubes Carbon.Search in Google Scholar

[5] MARLOW, G. S.—DAS, M. B. : The Effect of Contact Size and Non-Zero Metal Resistance on the Determination of Specific Contact Resistance, Solid-State Electronics 25 No. 2 (1982), 91–94.10.1016/0038-1101(82)90036-3Search in Google Scholar

[6] KINDER, R.—MIKOLÁŠEK, M.— DONOVAL, D.— KOVÁČ, J.—TLACZALA, M. : Measurement System with Hall and Four Point probes for Characterization of Semiconductors, Journal of Electrical Engineering 64 No. 2 (2013), 106–111.10.2478/jeec-2012-0015Search in Google Scholar

[7] LIDAY, J.—VOGRINČIČ, P.—VRETENÁR, V.—KOTLÁR, M.—MARTON, M.—VÁVRA, I.—HOTOVÝ, I.—BREZA, J. —ŘEHÁČEK, V. : The Layers of Carbon Nanomaterials as the Base of Ohmic Contacts to p-GaN, Applied Surface Science 312 (2013), 63-67.10.1016/j.apsusc.2014.05.156Search in Google Scholar