Open Access

UV-Vis studies of 800 keV Ar ion irradiated NiO thin films


Cite

[1] ZHAI P., YI Q., JIAN J., WANG H., SONG P., DONG C., LU X., SUN Y., ZHAO J., DAI X., LOU Y., YANG H., ZOU G., Chem. Commun., 50 (2014), 1854.10.1039/c3cc48877b24402170Search in Google Scholar

[2] AL-KAHLOUT A., PAWLICKA A., AEGERTER M., Sol. Energy Mater. Sol. C, 90 (2006), 3583.10.1016/j.solmat.2006.06.053Search in Google Scholar

[3] LOU XC, ZHAO XJ, HE X, Sol. Energy, 83 (2009), 2103.10.1016/j.solener.2009.06.020Search in Google Scholar

[4] IRWIN M.D., BUCHHOLZ D.B., HAINS A.W., CHANG R.P.H., MARKS T.J., Proc. Natl. Acad. Sci. USA, 105 (2008), 2783.10.1073/pnas.0711990105Search in Google Scholar

[5] STEINEBACH H, KANNAN S, RIETH L, SOLZBACHER F, Sensor. Actuat. B-Chem., 151 (2010), 162.10.1016/j.snb.2010.09.027Search in Google Scholar

[6] TSAI S.-Y., HON M.-H., LU Y.-M., Solid-State Electron., 63 (2011), 37.10.1016/j.sse.2011.04.019Search in Google Scholar

[7] LEE Y.-M., YANG H.-W., HUANG C.-M, J. Phys. D Appl. Phys., 45 (2012), 225302.10.1088/0022-3727/45/22/225302Search in Google Scholar

[8] MALLICK P., AGARWAL D.C., RATH CHANDANA, BISWAL R., BEHERA D., AVASTHI D.K., KANJILAL D., SATYAM P.V., MISHRA N.C., Nucl. Instrum. Meth. B, 266 (2008), 3332.10.1016/j.nimb.2008.04.013Search in Google Scholar

[9] MALLICK P., RATH CHANDANA, PRAKASH JAI, MISHRA D.K., CHOUDHARY R.J., PHASE D.M., TRIPATHI A., AVASTHI D.K., KANJILAL D., MISHRA N.C., Nucl. Instrum. Meth. B, 268 (2010), 1613.10.1016/j.nimb.2010.02.005Search in Google Scholar

[10] MALLICK P., DASH B.N., SOLANKI V., VARMA S., MISHRA N.C., Adv. Sci. Eng. Med., 6 (10) (2014), 1118.10.1166/asem.2014.1620Search in Google Scholar

[11] REGUIG B.A., KHELIL A., CATTIN L., MORSLI M., BERNEDE J.C., Appl. Surf. Sci., 253 (2007), 4330.10.1016/j.apsusc.2006.09.046Search in Google Scholar

[12] CHEN H.L., LU Y.M., HWANG W.S., Surf. Coat. Technol., 198 (2005), 138.10.1016/j.surfcoat.2004.10.032Search in Google Scholar

[13] MOHANTY P., RATH CHANDANA, MALLICK P., BISWAL R., MISHRA N.C., Physica B, 405 (2010), 2711.10.1016/j.physb.2010.03.064Search in Google Scholar

[14] AHMAD S., ASHRAF M., AHMAD A., SINGH D.V., Arab. J. Sci. Eng., 38 (2013), 1889.10.1007/s13369-013-0551-zSearch in Google Scholar

[15] MALLICK P., MISHRA D.K., KUMAR P., KANJILAL D., Indian J. Phys., 88 (7) (2014), 691.10.1007/s12648-014-0474-xSearch in Google Scholar

[16] KUMAR P., RODRIGUES G., RAO U.K., SAFVAN C.P., KANJILAL D., ROY A., Pramana, 59 (2002), 805.10.1007/s12043-002-0094-4Search in Google Scholar

[17] MOTT N.F., DAVIES E.A., Electronic Processes in Non-Crystalline Materials, Clarendon Press, Oxford, 1979.Search in Google Scholar

[18] BANERJEE A.N., CHATTOPADHYAY K.K., Reactive SputteredWide-Bandgap p-Type Semiconducting Spinel AB, in: DEPLA D., MAHEIU S. (Eds.), Reactive Sputter Deposition, Springer-Verlag, Berlin Heidelberg, 2008, p.413.10.1007/978-3-540-76664-3_12Search in Google Scholar

[19] LI X, ZHANG X, LI Z, QIAN Y, Solid State Commun., 137 (2006), 581.10.1016/j.ssc.2006.01.031Search in Google Scholar

[20] POWELL R.J., SPICER W.E., Phys. Rev. B, 2 (1970), 2182.10.1103/PhysRevB.2.2182Search in Google Scholar

[21] KUIPER P., KRUIZINGA G., GHIJSEN J., SAWATZKY G.A., VERWEIJ H., Phys. Rev. Lett., 2 (1989), 221.10.1103/PhysRevLett.62.22110039954Search in Google Scholar

[22] HUFNER S., STEINER P., REINERT F., SCHMITT H., SANDL P., Z. Phys. B, 88 (1992), 247.10.1007/BF01323579Search in Google Scholar

[23] MACKRODT W.C., NOGUERA C., Surf. Sci., 457 (2000), L386.10.1016/S0039-6028(00)00405-2Search in Google Scholar

[24] KUMAR V., SINGH J.K., Ind. J. Pure Appl. Phys., 48 (2010), 571.Search in Google Scholar

[25] FREITAG A., STAEMMLER V., CAPPUS D., VENTRICE C.A., AL SHAMERY K., KUHLENBECK H., FREUND H.-J., Chem. Phys. Lett., 210 (1993), 10.10.1016/0009-2614(93)89091-USearch in Google Scholar

[26] NEWMAN R., CHRENKO R.M., Phys. Rev., 114 (1959), 1507.10.1103/PhysRev.114.1507Search in Google Scholar

[27] PROPACH V., REINEN D., DRENKHALN H., BUSCHBAUM H. MULLER, Z. Naturforsch., 33b (1978) 619.10.1515/znb-1978-0611Search in Google Scholar

[28] COX P.A., WILLIAMS A.A., Surf. Sci., 152 (1985), 791.10.1016/0039-6028(85)90489-3Search in Google Scholar

[29] FROMME B., SCHMITT M., KISKER E., GORSCHLU¨TER A., MERZ H., Phys. Rev. B, 50 (1994), 1874.10.1103/PhysRevB.50.1874Search in Google Scholar

[30] GRAAF C. DE, BROER R., NIEUWPOORT W.C., Chem. Phys., 208 (1996), 35.10.1016/0301-0104(96)00083-3Search in Google Scholar

[31] SATITKOVITCHAI K., PAVLYUKH Y., HÜBNER W., Phys. Rev. B, 67 (2003), 165413.10.1103/PhysRevB.67.165413Search in Google Scholar

[32] GELEIJNS M., GRAAF C. DE, BROER R., NIEUWPOORT W.C., Surf. Sci., 421 (1999), 106.10.1016/S0039-6028(98)00835-8Search in Google Scholar

[33] MACKRODT W.C., NOGUERA C., ALLAN N.L., Faraday Discuss., 114 (1999), 105.10.1039/a904185kSearch in Google Scholar

[34] FROMME B., MÖLLER M., ANSCHÜTZ TH., BETHKE C., KISKER E., Phys. Rev. Lett., 77 (1996), 1548.10.1103/PhysRevLett.77.154810063106Search in Google Scholar

[35] XU C., OH W.S., GUO Q., GOODMAN D.W., J. Vac.Sci. Technol. A, 14 (1996), 1395.10.1116/1.579960Search in Google Scholar

[36] GUO Q., XU C., GOODMAN D.W., Langmuir, 14 (1998), 1371. 10.1021/la9707235Search in Google Scholar

eISSN:
2083-134X
Language:
English
Publication timeframe:
4 times per year
Journal Subjects:
Materials Sciences, other, Nanomaterials, Functional and Smart Materials, Materials Characterization and Properties