Otwarty dostęp

Software Measurement and Defect Prediction with Depress Extensible Framework


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Lech Madeyski
Lech Madeyski is with the Faculty of Computer Science and Management, Wroclaw University of Technology, Poland.
Marek Majchrzak
Marek Majchrzak is with the Faculty of Computer Science and Management, Wroclaw University of Technology and Capgemini Poland.
eISSN:
2300-3405
Język:
Angielski
Częstotliwość wydawania:
4 razy w roku
Dziedziny czasopisma:
Computer Sciences, Artificial Intelligence, Software Development