[Tougaard, S. (2005). XPS for Quantitative Analysis of Surface Nano-structures. Microsc. Microanal. 11(2), 676-677. DOI:10.1017/S1431927605500229.10.1017/S1431927605500229]Search in Google Scholar
[Jablonski, A. & Powell, C. J. (2004). Electron effective attenuation lengths in electron spectroscopies, J. Alloy. Compd. 362, 26-32. DOI:10.1016/S0925-8388(03)00558-9.10.1016/S0925-8388(03)00558-9]Search in Google Scholar
[Gunter, P. L. J. (1992). Evaluation of take-off-angle-dependent XPS for determining the thickness of passivation layers on aluminium and silicon. Surf Interface Anal. 19, 161-164. DOI: 10.1002/sia.740190131.10.1002/sia.740190131]Search in Google Scholar
[Suchorski, Y., Wrobel, R., Becker, S., Opalinska, A., Narkiewicz, U., Podsiadly, M. & Weiss, H. (2008). Surface chemistry of zirconia nanopowders doped with Pr2O3: an XPS study, Acta Phys Pol A, 114, 125 0150 134.10.12693/APhysPolA.114.S-125]Search in Google Scholar
[Briggs, D. (2005). Surface analysis of polymers by XPS and static SIMS, Cambridge Solid State Science Series, Cambridge University Press.]Search in Google Scholar