<abstract xmlns="http://www.w3.org/1999/xhtml"><p>This study focuses on the description of oxidation of CdTe monocrystal surfaces after selective chemical etching. Measurements of surface morphology of the oxides occurring in short time are valuable for deeper understanding of the material degradation and fabrication of reliable devices with enhanced performance. The samples with (1 1 1) orientation were selectively etched and cleaned of oxide. Exposure of the oxide-free surfaces of CdTe to air at normal atmospheric conditions over 24 hours leads to an appearance of characteristic surface features. The oxidized surfaces were investigated by scanning electron microscopy, scanning probe microscopy, Raman spectroscopy and ellipsometry. The results indicate clear differences in the oxidation of Cd-terminated and Te-terminated surfaces.</p></abstract>

This study focuses on the description of oxidation of CdTe monocrystal surfaces after selective chemical etching. Measurements of surface morphology of the oxides occurring in short time are valuable for deeper understanding of the material degradation and fabrication of reliable devices with enhanced performance. The samples with (1 1 1) orientation were selectively etched and cleaned of oxide. Exposure of the oxide-free surfaces of CdTe to air at normal atmospheric conditions over 24 hours leads to an appearance of characteristic surface features. The oxidized surfaces were investigated by scanning electron microscopy, scanning probe microscopy, Raman spectroscopy and ellipsometry. The results indicate clear differences in the oxidation of Cd-terminated and Te-terminated surfaces.

Characterization of the native oxide on CdTe surfaces

Faculty of Electrical Engineering and Communication, Physics Department

Central European Institute of Technology BUT

Department of Condensed Matter Physics, Faculty of Science

EP220, Electrical Engineering and Physics

Materials Science-Poland

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

{"article-title":"Characterization of the native oxide on CdTe surfaces"}

This study focuses on the description of oxidation of CdTe monocrystal surfaces after selective chemical etching. Measurements of surface morphology of the...

Characterization of the native oxide on CdTe surfaces

Pubblicato online: 02 ago 2019

Pagine: 206 - 211

Ricevuto: 22 mar 2018

Accettato: 18 mar 2019

DOI: https://doi.org/10.2478/msp-2019-0030

Parole chiave
selective etching, scanning probe microscopy, ellipsometry, Raman spectroscopy

© 2019 Dinara Sobola et al., published by Sciendo

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

Characterization of the native oxide on CdTe surfaces

Pubblicato online: 02 ago 2019

Pagine: 206 - 211

Ricevuto: 22 mar 2018

Accettato: 18 mar 2019

DOI: https://doi.org/10.2478/msp-2019-0030

Parole chiaveselective etching, scanning probe microscopy, ellipsometry, Raman spectroscopy

© 2019 Dinara Sobola et al., published by Sciendo

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

Parole chiave
selective etching, scanning probe microscopy, ellipsometry, Raman spectroscopy