Accesso libero

Synthesis, characterization and photovoltaic properties of Mn-doped Sb2S3 thin film

INFORMAZIONI SU QUESTO ARTICOLO

Cita

[1] GROZDANOV I., Semicond. Sci. Tech., 9 (1994), 1234.10.1088/0268-1242/9/6/013Search in Google Scholar

[2] FORGUE S.V., GOODRICH R.R., COPE A.D., RCA Rev., 12 (1951), 335.Search in Google Scholar

[3] ARUN P., VEDESHWAR G., J. Mater. Sci., 31 (1996), 6507.10.1007/BF00356255Open DOISearch in Google Scholar

[4] KRISHNAN B., ARATO A., CARDENAS E., Appl. Surf. Sci., 254 (2008), 3200.10.1016/j.apsusc.2007.10.098Search in Google Scholar

[5] KYONO A., KIMATA M., MATSUHISA M., MIGASHITA Y., OKAMOTO K., Phys. Chem. Miner., 29 (2002), 254.10.1007/s00269-001-0227-1Open DOISearch in Google Scholar

[6] VERSAVEL M.I., HABER J.A., Thin Solid Films, 515 (2007), 7171.10.1016/j.tsf.2007.03.043Search in Google Scholar

[7] HONGWEI L., GUANG Y., YAXIONG G., LIANGBIN X., PINGLI Q., XIN D., XIAOLU Z., WEIJUN K., HONG T., ZHAO C., BORUI L., GUOJIA F., Phys. Chem. Chem. Phys., 18 (2016), 16436.10.1039/C6CP02072K27264190Open DOISearch in Google Scholar

[8] TZOFIA E., EYAL T., LIOZ E., J. Phys. Chem. C., 119 (2015), 12904.10.1021/acs.jpcc.5b04231Search in Google Scholar

[9] YAHUITL O.M., THOMAS P.W., RONGPING W., ZHIYONG Y., KYLIE R.C., Phys. Status Solidi A, 213 (2015), 108.Search in Google Scholar

[10] YONG C.C., DONG U.L., JUN H.N., EUN K.K., Adv. Funct. Mater., 24 (2014), 3587.10.1002/adfm.201470160Search in Google Scholar

[11] ZHONG J., XIAOJIAN Z., YONGJIA Z., MAN Z., MINGJU W., SUJUAN W., JINWEI G., XINGSEN G., JUN-MING L., HONGBO Z., ACS Appl. Mater. Inter., 5 (2013), 8345.10.1021/am401273r23944152Open DOISearch in Google Scholar

[12] MUSHTAQ S., BUSHRA I., MUHAMMAD R., AURANG Z., Nat. Sci., 8 (2016), 33.Search in Google Scholar

[13] CHEN W., MALM J.O., ZWILLER V., HUANG Y., LIU S., WALLENBERG R., BOVIN J.O., SAMUELSON L., Phys. Rev. B., 61 (2000), 11021.10.1103/PhysRevB.61.11021Open DOISearch in Google Scholar

[14] REN G., LIN Z., WANG C., LIU W., ZHANG J., HUANG F., LIANG J., Nanotechnol., 18 (2007), 035705.10.1088/0957-4484/18/3/03570519636136Search in Google Scholar

[15] SAMBASIVAM S., JOESPH D.P., LIN J.G., VENKATESWARAN C., J. Solid State Chem., 182 (2009), 2598.10.1016/j.jssc.2009.07.015Search in Google Scholar

[16] LAKSHMI P.V.B., RAJ K.S., RAMACHANDRAN K., Cryst. Res. Technol., 44 (2009), 153.10.1002/crat.200800271Open DOISearch in Google Scholar

[17] LAZOS C.G., ROSENDO E., JUÁREZ H., SALGADO G.G., DIAZ T., FALFÁN M.R., OLIVA A.I., QUINTANA P., AGUILAR D.H., CAUICH W., J. Electrochem. Soc., 155 (2008), 158.10.1149/1.2820620Search in Google Scholar

eISSN:
2083-134X
Lingua:
Inglese
Frequenza di pubblicazione:
4 volte all'anno
Argomenti della rivista:
Materials Sciences, other, Nanomaterials, Functional and Smart Materials, Materials Characterization and Properties