Switching Magnetization Magnetic Force Microscopy — An Alternative to Conventional Lift-Mode MFM

CAMBEL, V.—ELIÁŠ, P.—GREGUŠOVÁ, D.—MARTAUS, J.—FEDOR, J.—KARAPETROV, G.—NOVOSAD, V.: Magnetic Elements for Switching Magnetization Magnetic Force Microscopy Tips, J. Magnetism Magn. Mater. 322 (2010), 2715-2721.10.1016/j.jmmm.2010.04.014Search in Google Scholar

MARTIN, Y.—WICKRAMASINGHE, H. K.: Magnetic Imaging by Force Microscopy" with 1000Å Resolution, Appl. Phys. Lett. 50 (1987), 1455-1457.10.1063/1.97800Search in Google Scholar

SÁENZ, J. J.—GARCÍA, N.—GRÜTTER, P.—MEYER, E.—HEINZELMANN, H.—WIESENDANGER, R.—ROSENTHALER, L.—HIDBER, H. R.—GÜNTHERODT, H.-J.: Observation of magnetic forces by the atomic force microscope, J. Appl. Phys. 62 (1987), 4293-4295.10.1063/1.339105Search in Google Scholar

RUGAR, D.—MAMIN, H. J.—GUETHNER, P.—LAMBERT, S. E.—STERN, J. E.—MCFAYDEN, I.—YOGI, T.: Magnetic Force Microscopy: General Principles and Application to Longitudinal Recording Media, J. Appl. Phys. 68 (1990), 1169.10.1063/1.346713Search in Google Scholar

ABELMANN, L.—PORTHUN, S.—HAAST, M.—LODDER, C.—MOSER, A.—BEST, M. E.—van SCHENDEL, P. J. A.—STIEFEL, B.—HUG, H. J.—HEYDON, G. P.—FARLEY, A.—HOON, S. R.—PFAFFELHUBER, T.—PROKSCH, R.—BABCOCK, K.: Comparing the Resolution of Magnetic Force Microscopes using the CAMST Reference Samples, J. Magn. Magn. Mater. 190 (1998), 135-147.10.1016/S0304-8853(98)00281-9Search in Google Scholar

PU, A.—THOMSON, D. J.: Sub-Micron Resolution Magnetic Force Microscopy Mapping of Current Paths with Large Probe-to-Sample Separation, Meas. Sci. Technol. 18 (2007), L19-L22.10.1088/0957-0233/18/8/L01Search in Google Scholar

ALBRECHT, T. R.—GRÜTTER, P.—HORNE, D.—RUGAR, D.: Frequency Modulation Detection using High-Q Cantilevers for Enhanced Force Microscope Sensitivity, J. Appl. Phys. 69 (1991), 668-673.10.1063/1.347347Search in Google Scholar

BABCOCK, K. L.—ELINGS, V. B.—GURLEY, A.—KJOLLER, K.: Method and Apparatus For Obtaining Improved Vertical Metrology Measurements, US Patent No. 5,898,106, Digital Instruments, Santa Barbara, CA (1999).Search in Google Scholar

GUARISCO, D.—NGUY, H.: High Linear Density in Perpendicular Recording, J. Appl. Phys. 93 (2003), 6745-6747.10.1063/1.1557713Search in Google Scholar

MARTIN, J. I.—NOGUES, J.—LIU, K.—VICENT, J. L.—SCHULLER, I. K.: Ordered Magnetic Nanostructures: Fabrication and Properties, J. Magn. Magn. Mater. 256 (2003), 449-501.10.1016/S0304-8853(02)00898-3Search in Google Scholar

GEERPURAM, D. N.—MANI, A. S.—BASKARAN, V. S.: A Novel Magnetic Random Access Memory Design using Square Ring Elements for the Hard Layer, J. Electron. Mater. 33 (2004), 1269-1273.10.1007/s11664-004-0152-4Search in Google Scholar

WOOD, R.: The Feasibility of Magnetic Recording at 1 Terabit per Square, IEEE Trans. Magn. 36 (2000), 36-42.10.1109/20.824422Search in Google Scholar

GRÜTTER, P.—WADAS, A.—MEYER, E.—HEINZELMANN, H.—HIDBER, H.-R.—GRÜNTERODT, H.-J.: High Resolution Magnetic Force Microscopy, J. Vac. Sci. Technol. A8 (1990), 406-409.10.1116/1.576408Search in Google Scholar

MAMIN, H. J.—RUGAR, D.—STERN, J. E.—FONTANA, R. E.—KASIRAJ, P.: Magnetic Force Microscopy of Thin Permalloy Films, Appl. Phys. Lett. 55 (1989), 318-320.10.1063/1.101898Search in Google Scholar

ENGEL-HERBERT, R.—SCHAADT, D. M.—HESJEDAL, T.: Analytical and Numerical Calculations of the Magnetic Force Microscopy Response: A Comparison, J. Appl. Phys. 99 (2006), 113905.10.1063/1.2202242Search in Google Scholar

STREBLECHENKO, D. G.—SCHEINFEIN, M. R.—MANKOS, M.—BABCOCK, K.: Quantitative Magnetometry using Electron Holography: Field Profiles Near Magnetic Force Microscope Tips, IEEE Trans. Magn. 32 (1996), 4124-4129.10.1109/20.539316Search in Google Scholar

SCOTT, J.—MCVITIE, S.—FERRIER, R. P.—GALLAGHER, A.: Electrostatic Charging Artefacts in Lorentz Electron Tomography of MFM Tip Stray Fields, J. Phys. D 34 (2001), 1326-1332.10.1088/0022-3727/34/9/307Search in Google Scholar

THIAVILLE, A.—BELLIARD, L.—MAJER, D.—ZELDOV, E.—MILTAT, J.: Measurement of the Stray Field Emanating from Magnetic Force Microscope Tips by Hall Effect Microsensors, J. Appl. Phys. 82 (1997), 3182-3191.10.1063/1.365623Search in Google Scholar

YOSHIDA, N.—YASUTAKE, M.—ARIE, T.—AKITA, S.—NAKAYAMA, Y.: Quantitative Analysis of the Magnetic Properties of Metal-Capped Carbon Nanotube Probe, Jpn. J. Appl. Phys. 41 (2002), 5013-5016.10.1143/JJAP.41.5013Search in Google Scholar

KURAMOCHI, H.—MANAGO, T.—KOLTSOV, D.—TAKENAKA, M.—IITAKE, M.—AKINAGA, H.: Advantages of CNTMFM Probes in Observation of Domain Walls of Soft Magnetic Materials, Surf. Science 601 (2007), 5289-529.10.1016/j.susc.2007.04.222Search in Google Scholar

KOBLISHKA, M. R.—HARTMANN, U.—SULZBACH, T.: — Improvements of the Lateral Resolution of the MFM Technique, Thin Solid Films 428 (2003), 93-97.10.1016/S0040-6090(02)01278-6Search in Google Scholar

KOBLISHKA, M. R.—HARTMANN, U.—SULZBACH, T.: Resolving Magnetic Nanostructures in the 10-nm Range using MFM at Ambient Conditions, Mat. Sci. Engin. C23 (2003), 747-751.10.1016/j.msec.2003.09.146Search in Google Scholar

HUANG, H. S.—LIN, M.W.—SUN, Y. C.—LIN, L. J.: Improving the Spatial Resolution of a Magnetic Force Microscope Tip via Focused Ion Beam Modification and Magnetic Film Coating, Scr. Mat. 56 (2007), 365-368.10.1016/j.scriptamat.2006.11.014Search in Google Scholar

FOLKS, L.—BEST, M. E.—RICE, P. M.—TERRIS, B. D.—WELLER, D.: Perforated Tips for High-Resolution In-Plane Magnetic Force Microscopy, Appl. Phys. Lett. 76 (2000), 909-911.10.1063/1.125626Search in Google Scholar

WOLNY, F.—WEISSKER, U.—MÜHL, T.—LEONHARDT, A.—MENZEL, S.—WINKLER, A.—BÜCHNER, B.: Iron-Filled Carbon Nanotubes as Probes for Magnetic Force Microscopy, J. Appl. Phys. 104 (2008), 064908.10.1063/1.2980281Search in Google Scholar

KIRTLEY, J. R.—DENG, Z.—LUAN, L.—YENILMEZ, E.—DAI, H.—MOLER, K. A.: Moment Switching in Nanotube Magnetic Force Probes, Nanotechnology 18 (2007), 465506.10.1088/0957-4484/18/46/465506Search in Google Scholar

CAMBEL, V.—KARAPETROV, G.—BELKIN, A.—NOVOSAD, V.—ELIÁŠ, P.—GREGUŠOVÁ, D.—FEDOR, J.—KOSTIČ, I.—KÚDELA, R.—ŠOLT YS, J.: Switching Magnetization MFM - Novel Approach to Magnetic Field Imaging, In: Book of abstracts, ISPM (International Scanning Probe Microscopy Conference), Seattle, Washington, USA, June 22-24, (2008).Search in Google Scholar

CAMBEL, V.—GREGUŠOVÁ, D.—KÚDELA, R.: Formation of GaAs Three-Dimensional Objects using AlAs "Facet-Forming" Sacrificial Layer and H₃PO₄, H₂O₂, H₂O based solution, J. Applied Physics 94 (2003), 4643-4648.10.1063/1.1602570Search in Google Scholar

ŠOLTÝS, J.—GREGUŠOVÁ, D.—KÚDELA, R.—KUČERA, M.—KOSTIČ, I.—ZAHORAN, M.—CAMBEL, V.: Technology of "Active" Tips for Magnetic and Electric Force Microscopy, In: Book of abstracts, ISPM (International Scanning Probe Microscopy Conference), Seattle, Washington, USA, June 22-24, (2008).Search in Google Scholar

GREGUŠOVÁ, D.—ELI AŠ, P.—ÖSZI, Z.—KÚDELA, R.— ŠOLTÝ S, J.—FEDOR, J.—CAMBEL, V.—KOSTIČ, I.: Technology and Properties of a Vector Hall Sensor, Microelectronics J. 37 (2006), 1543-1546.10.1016/j.mejo.2006.05.017Search in Google Scholar

GARCÍA, J. M.—THIAVILLE, A.—MILTAT, J.—KIRK, K. J.—CHAPMAN, J. N.: MFM Imaging of Patterned Permalloy Elements under an External Applied Field, J. Mag. Mag. Mat. 242 (2002), 1267-1269.10.1016/S0304-8853(01)01027-7Search in Google Scholar

SCHNEIDER, M.—HOFFMANN, H.—ZWECK, J.: Magnetisation Reversal of Thin Submicron Elliptical Permalloy Elements, J. Mag. Mag. Mat. 257 (2003), 1-10.10.1016/S0304-8853(02)00979-4Search in Google Scholar

ZHU, X.—GRÜTTER, P.—METLUSHKO, V.—HAO, Y.—CASTANO, F. J.—ROSS, A.—ILIC, B.—SMITH, H. I.: Construction of Hysteresis Loops of Single Domain Elements and Coupled Permalloy Ring Arrays by Magnetic Force Microscopy, J. Appl. Phys. 93 (2003), 8540-8542.10.1063/1.1540129Search in Google Scholar

ZHU, X.—GRÜTTER, P.—METLUSHKO, V.—ILIC, B.: Magnetic Force Microscopy Study of ElectronBeam-Patterned Soft Permalloy Particles: Technique and Magnetization Behavior, Phys. Rev. B66 (2002), 024423.10.1103/PhysRevB.66.024423Search in Google Scholar

BRYAN, M. T.—ATKINSON, D.—COWBURN, R. P.: Experimental Study of the Influence of Edge Roughness on Magnetization Switching in Permalloy Nanostructures, Appl. Phys. Lett. 85 (2004), 3510-3512.10.1063/1.1806566Search in Google Scholar

CHANG, C. C.-CHANG, Y. C.—CHUNG, W. S.—WU, J. C.—WIE, Z. H.—LAI, M. F.—CHANG, C. R.: Influences of the Aspect Ratio and Film Thickness on Switching Properties of Elliptical Permalloy Elements, IEEE Trans. on Magnetics 41 (2005), 947-949.10.1109/TMAG.2004.842131Search in Google Scholar

http://math.nist.gov/oommfSearch in Google Scholar

IMRE, A.—CSABA, G.—JI, L.—ORLOV, A.—BERNSTEIN, G. H.—POROD, W.: Majority Logic Gate for Magnetic Quantum-Dot Cellular Automata, Science 311 (2006), 205-207.10.1126/science.112050616410520Search in Google Scholar