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Effect of sintering parameters using the central composite design method, electronic structure and physical properties of yttria-partially stabilized ZrO2 commercial ceramics


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(a) XRD patterns of 3Y-PSZ non-sintered ceramics (I) and 3Y-PSZ ceramics sintered at different temperatures (II to XII) and times, (b) Indexed monoclinic and tetragonal phases in XRD patterns of 3Y-PSZ ceramics. The vertical lines indicate the relative positions of the diffraction peaks described in ICSD No. 66782 and No. 18190 and (c) Indexed tetragonal phase XRD patterns for 3Y-PSZ ceramics sintered at 1550 °C for 12 h, respectively.
(a) XRD patterns of 3Y-PSZ non-sintered ceramics (I) and 3Y-PSZ ceramics sintered at different temperatures (II to XII) and times, (b) Indexed monoclinic and tetragonal phases in XRD patterns of 3Y-PSZ ceramics. The vertical lines indicate the relative positions of the diffraction peaks described in ICSD No. 66782 and No. 18190 and (c) Indexed tetragonal phase XRD patterns for 3Y-PSZ ceramics sintered at 1550 °C for 12 h, respectively.

(a) Rietveld refinement plot of 3Y-PSZ non-sintered ceramics and (b) 3Y-PSZ ceramics sintered at 1550 °C for 12 h.
(a) Rietveld refinement plot of 3Y-PSZ non-sintered ceramics and (b) 3Y-PSZ ceramics sintered at 1550 °C for 12 h.

(a) Schematic representation of the monoclinic unit cells corresponding to ZrO2 crystal illustrating distorted deltahedral [ZrO7] clusters, (b) tetragonal unit cells corresponding to ZrO2 crystal illustrating distorted deltahedral [ZrO8] clusters and (c) tetragonal unit cells corresponding to ZrO2 crystals illustrating distorted deltahedral [ZrO8]/[YO8] clusters, respectively.
(a) Schematic representation of the monoclinic unit cells corresponding to ZrO2 crystal illustrating distorted deltahedral [ZrO7] clusters, (b) tetragonal unit cells corresponding to ZrO2 crystal illustrating distorted deltahedral [ZrO8] clusters and (c) tetragonal unit cells corresponding to ZrO2 crystals illustrating distorted deltahedral [ZrO8]/[YO8] clusters, respectively.

Electron density maps on: (a) (1 2 1), (b) (1 4 1), (c) (6 3 6) and (d) (1 2 0) planes of 3Y-PSZ non-sintered ceramics and ceramics sintered at 1550 °C for 12 h.
Electron density maps on: (a) (1 2 1), (b) (1 4 1), (c) (6 3 6) and (d) (1 2 0) planes of 3Y-PSZ non-sintered ceramics and ceramics sintered at 1550 °C for 12 h.

FE-SEM images for 3Y-PSZ ceramics sintered at: (a) 1350 °C for 4 h, (b) 1350 °C for 12 h, (c) 1550 °C for 4 h and (d) 1550 °C for 12 h.
FE-SEM images for 3Y-PSZ ceramics sintered at: (a) 1350 °C for 4 h, (b) 1350 °C for 12 h, (c) 1550 °C for 4 h and (d) 1550 °C for 12 h.

Average grain size distribution of 3Y-PSZ ceramics sintered at: (a) 1350 °C for 4 h, (b) 1350 °C for 12 h, (c) 1550 °C for 4 h and (d) 1550 °C for 12 h.
Average grain size distribution of 3Y-PSZ ceramics sintered at: (a) 1350 °C for 4 h, (b) 1350 °C for 12 h, (c) 1550 °C for 4 h and (d) 1550 °C for 12 h.

Response surfaces of 3Y-PSZ ceramics sintered at different temperatures and times for: (a) volumetric shrinkage, (b) average grain size and (c) hardness.
Response surfaces of 3Y-PSZ ceramics sintered at different temperatures and times for: (a) volumetric shrinkage, (b) average grain size and (c) hardness.

Volumetric shrinkage (VS), average grain size (AGS) and Vickers hardness (VH) for all combinations of sintering temperature and times.

3Y-PSZ sintered ceramicsMeasured values
VS [%]AGS [μm]VH [GPa]
VII44.1±3.40.194±0.0435.45±0.12
XII40.6±5.40.216±0.0536.05±0.22
X45.0±5.80.228±0.0577.49±0.42
VIII50.2±5.90.276±0.07411.3±0.18
VI50.7±2.30.31±0.1113.01±0.42
II50.3±2.80.384±0.09113.27±0.38
XI50.2±2.90.377±0.09613.06±0.41
III53.1±5.20.454±0.08513.71±0.12
IX54.2±5.50.55±0.1413.26±0.30
IV54.8±4.20.75±0.1912.52±0.32
V54.8±1.70.54±0.1813.24±0.16

Coded and uncoded values of levels for sintering temperature and time and its execution order.

3Y-PSZ sintered ceramicsCoded LevelsUncoded Levels
TemperaturetimeTemperature [°C]time [h]
VII–1.41013098
XII–1–113504
X–11135012
VIII0–1.4114502.37
VI0014508
II0014508
XI0014508
III01.41145013.64
IX1–115504
IV11155012
V1.41015918

Rietveld refinement results for 3Y-PSZ non-sintered ceramics and ceramics sintered at 1550 °C for 12 h.

AtomsWyckoffSitexyz
Zr4e10.269770.035420.21178
O14e10.072870.342620.35167
O24e10.438430.761340.48151
Zr2a–4m20.750.250.25
O14d2mm.0.250.250.46829
[Phase 1: ZrO2; P21/c (14) – Monoclinic (a = 5.18449(8), b = 5.21618(4) Å, c = 5.32812(7) Å; V = V=142.22(3) Å3; β = 99.23(8)° and Z = 4)] and [Phase 2: ZrO2; P42/nmc (137) – Tetragonal (a = b = 3.5792 Å, c = 5.1782 Å; c/a = 1, V = 66.34 Å3; Z = 2]; Rp = 6.785 %; Rwp = 11.835 %; Rexp = 6.218 %; χ2 = 3.6214 and GoF = 1.903. Weights of the phases in the ZrO2 Monoclinic = 49.17 % and ZrO2 Tetragonal = 50.83 %.
Zr2a– 4m20.750.250.25
O14d2mm.0.250.250.44896
[Monophasic for ZrO2; P42/nmc (137) – Tetragonal (a = b = 3.5578(6) Å, c = 5.1559(1) Å; V = 65.26(2) Å3; Z = 2); Rp = 5.231 %; Rwp = 10.124 %; Rexp = 8.173 %; χ2 = 1.52364 and GoF = 1.238.
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