Login
Register
Reset Password
Publish & Distribute
Publishing Solutions
Distribution Solutions
Subjects
Publications
Journals
Books
Proceedings
Publishers
Blog
Contact
Search
Cart
EUR
USD
GBP
English
English
Deutsch
Polski
Español
Français
Italiano
Home
Journals
Journal of Electrical Engineering
Volume 62 (2011): Issue 6 (November 2011)
Open Access
Coupled Defect Level Recombination in the P—N Junction
Juraj Racko
Juraj Racko
,
Miroslav Mikolášek
Miroslav Mikolášek
,
Peter Benko
Peter Benko
,
Ondrej Gallo
Ondrej Gallo
,
Ladislav Harmatha
Ladislav Harmatha
,
Ralf Granzner
Ralf Granzner
and
Frank Schwierz
Frank Schwierz
| Dec 21, 2011
Journal of Electrical Engineering
Volume 62 (2011): Issue 6 (November 2011)
About this article
Previous Article
Next Article
Abstract
References
Authors
Articles in this Issue
Preview
PDF
Cite
Share
Published Online:
Dec 21, 2011
Page range:
355 - 358
DOI:
https://doi.org/10.2478/v10187-011-0056-5
Keywords
tunneling
,
coupled levels
This content is open access.
Juraj Racko
Slovak University of Technology, Ilkovičova 3, 812 19 Bratislava, Slovakia
Miroslav Mikolášek
Slovak University of Technology, Ilkovičova 3, 812 19 Bratislava, Slovakia
Peter Benko
Slovak University of Technology, Ilkovičova 3, 812 19 Bratislava, Slovakia
Ondrej Gallo
Slovak University of Technology, Ilkovičova 3, 812 19 Bratislava, Slovakia
Ladislav Harmatha
Slovak University of Technology, Ilkovičova 3, 812 19 Bratislava, Slovakia
Ralf Granzner
Technical University Ilmenau, PF 98684 Ilmenau, Germany
Frank Schwierz
Technical University Ilmenau, PF 98684 Ilmenau, Germany