Login
Register
Reset Password
Publish & Distribute
Publishing Solutions
Distribution Solutions
Subjects
Publications
Journals
Books
Proceedings
Publishers
Blog
Contact
Search
Cart
EUR
USD
GBP
English
English
Deutsch
Polski
Español
Français
Italiano
Home
Journals
Journal of Electrical Engineering
Volume 62 (2011): Issue 1 (January 2011)
Open Access
Switching Magnetization Magnetic Force Microscopy — An Alternative to Conventional Lift-Mode MFM
Vladimír Cambel
Vladimír Cambel
,
Dagmar Gregušová
Dagmar Gregušová
,
Peter Eliáš
Peter Eliáš
,
Ján Fedor
Ján Fedor
,
Ivan Kostič
Ivan Kostič
,
Ján Maňka
Ján Maňka
and
Peter Ballo
Peter Ballo
| Jun 07, 2011
Journal of Electrical Engineering
Volume 62 (2011): Issue 1 (January 2011)
About this article
Previous Article
Next Article
Abstract
References
Authors
Articles in this Issue
Preview
PDF
Cite
Share
Published Online:
Jun 07, 2011
Page range:
37 - 43
DOI:
https://doi.org/10.2478/v10187-011-0006-2
Keywords
magnetic force microscopy
,
micromagnetic calculations
,
switching field
This content is open access.