[Bonnie Baker, Miro Oljaca, "How the voltage reference affects ADC performance Texas instruments "Data acquisition division".]Search in Google Scholar
[L. Michaeli, L. Sochová, and J. Saliga, "ADC look-up table based post correction combined with dithering," in XVIII IMEKO WORLD CONGRESS Rio de Janeiro, Brazil, 2006.]Search in Google Scholar
[N. Björsell and P. Händel, "Dynamic behavior models of analog to digital converters aimed for post-correction in wideband applications" in IMEKO World Congress, Rio de Janeiro, Brazil, 2006.]Search in Google Scholar
[Niclas Bjorsell and Peter Händel, "Post-Correction of Under-Sampled Analog to Digital Converters" IMTC 2007 Instrumentation and Measurement, Warsaw, Poland, May 1-3, 2007.10.1109/IMTC.2007.379429]Search in Google Scholar
[Russell Anderson, "Understanding Ratio Metric Conversions", Texas Instruments Application Report SBAA110-March 2004.]Search in Google Scholar
[F. Azais, S. Bernard, Y. Bertrand, M. Renovell LIRMM - University of Montpellier II,' Implemen-tation of a Linear Histogram BIST for ADCs".]Search in Google Scholar
[Helfrick, A. D., Cooper, W.D. (1990). Modern Electronic Instrumentation and Measurement Techniques. Englewood Cliffs, USA: Prentice-Hall.]Search in Google Scholar
[Miro Oljaca, Baker Bonnie, (2009) "How voltage reference affects ADC performance" Data acquisition, Analog Applications Journal.]Search in Google Scholar
