Open Access

Theoretical prediction of physical parameters of GexSb20−x Te80 (x = 11, 13, 15, 17, 19) bulk glassy alloys


Cite

[1] Kamiya T., Tsuchiya M., Jpn. J. Appl. Phys., 44 (2005), 5875. http://dx.doi.org/10.1143/JJAP.44.587510.1143/JJAP.44.5875Search in Google Scholar

[2] Guillevic E., Zhang X., Pain T., Calvez L., Adam J.L., Lucas J., Guilloux-Viry M., Ollivier S., Gadret G., Opt. Mater., 31 (2009), 1688. http://dx.doi.org/10.1016/j.optmat.2009.04.00910.1016/j.optmat.2009.04.009Search in Google Scholar

[3] Todorov R., Tasseva J., Babeva T., Thin Chalcogenide Films for Photonic Applications, in: Massaro A. (Ed.), Photonic Crystals — Innovative Systems, Lasers and Waveguides, Intech, Croatia, 2012, p. 143 10.5772/32143Search in Google Scholar

[4] Samson L., Phys. Status Solidi RRL., 1–3 (2010), 010. Search in Google Scholar

[5] Lovalskiy, J. Micro/Nanolith. MEMS MOEMS, 84 (2009), 043012. http://dx.doi.org/10.1117/1.327396610.1117/1.3273966Search in Google Scholar

[6] Bureau B., Boussard-Pledel C., Lucas P., Zhang X., Lucas J., Molecules, 14 (2009), 4337. http://dx.doi.org/10.3390/molecules1411433710.3390/molecules14114337Search in Google Scholar

[7] Lankhorst M.H.R., Ketelaars B.W.S.M.M., Wolters R.A.M., Nat. Mater., 4 (2005) 347. http://dx.doi.org/10.1038/nmat135010.1038/nmat1350Search in Google Scholar

[8] Lee S.H., Hwang Y.N., Lee S.Y., Ryoo K.C. Ahn S.J., Koo H.C., Jeong C.W., Kim Y., Koh G.H., Jeong G.T., Jeong H.S., Kim K., VLSI Tech. Dig., 20 (2004), 173. Search in Google Scholar

[9] Tichy L., Ticha H., Mater. Lett., 21 (1994) 313. http://dx.doi.org/10.1016/0167-577X(94)90196-110.1016/0167-577X(94)90196-1Search in Google Scholar

[10] Tichy L., Ticha H., J. Non-Cryst. Solids, 189 (1995), 141. http://dx.doi.org/10.1016/0022-3093(95)00202-210.1016/0022-3093(95)00202-2Search in Google Scholar

[11] Panukchieva V., Szekers A., Optical Mat., 30(7) (2008), 1088. http://dx.doi.org/10.1016/j.optmat.2007.05.01610.1016/j.optmat.2007.05.016Search in Google Scholar

[12] Fouad S.S., J. Phys D Appl. Phys., 28 (1995), 2318. http://dx.doi.org/10.1088/0022-3727/28/11/01310.1088/0022-3727/28/11/013Search in Google Scholar

[13] Saffarini G., Schlieper A., Appl. Phys. A-Matter., 61 (1995), 29. http://dx.doi.org/10.1007/s00339005015910.1007/s003390050159Search in Google Scholar

[14] Pamukchieva V., Szekeres A., Todorova K., Fabian M., Svab E., Revay Z, Szentmiklosi L., J. Non-Cryst. Solids, 355 (2009), 2485 http://dx.doi.org/10.1016/j.jnoncrysol.2009.08.02810.1016/j.jnoncrysol.2009.08.028Search in Google Scholar

[15] Pauling L., The Nature of the Chemical Bond, 3rd ed., Cornell University Press, Ihica, NY, 1960. Search in Google Scholar

[16] Zhenhua L., J. Non-Cryst. Solids, 127 (1991), 298. http://dx.doi.org/10.1016/0022-3093(91)90482-L10.1016/0022-3093(91)90482-LSearch in Google Scholar

[17] Thorpe M.F., Tichy L., Properties and Applications of Amorphous Materials, Kluwer Academic Publishers, London, 2001 http://dx.doi.org/10.1007/978-94-010-0914-010.1007/978-94-010-0914-0Search in Google Scholar

[18] Bicerano J., Ovshinsky S.R., J. Non-Cryst. Solids, 74 (1985), 75. http://dx.doi.org/10.1016/0022-3093(85)90402-810.1016/0022-3093(85)90402-8Search in Google Scholar

[19] Pattanaik A.K., Srinivasan A., JOAM, 5 (2003), 1161. Search in Google Scholar

[20] Dahshan A., Aly K.A., Philos. Mag., 88 (2008), 361 http://dx.doi.org/10.1080/1478643070184621410.1080/14786430701846214Search in Google Scholar

[21] Deneufville J.P., Rockstad H.K., Stuke J., Brenig W., Amorphous and liquid semiconductors, Taylor & Frances, London, 1974. Search in Google Scholar

[22] Kastner M., Phys. Rev. Lett., 28 (1972), 355. http://dx.doi.org/10.1103/PhysRevLett.28.35510.1103/PhysRevLett.28.355Search in Google Scholar

[23] Kastner M., Phys. Rev. B, 7 (1973), 5237. http://dx.doi.org/10.1103/PhysRevB.7.523710.1103/PhysRevB.7.5237Search in Google Scholar

[24] Benoit C., Aigrain P., Balkanski, Selected constants relative to semiconductors, Pergamon Press, New York, 1961. Search in Google Scholar

[25] Fouad S.S., Vacuum, 52 (1999), 505. http://dx.doi.org/10.1016/S0042-207X(98)00339-X10.1016/S0042-207X(98)00339-XSearch in Google Scholar

[26] Sharma I, Tripathi S.K., Barman P.B., Philos. Mag. 88(25), (2008) 3018. http://dx.doi.org/10.1080/1478643080255263810.1080/14786430802552638Search in Google Scholar

[27] Othman A.A., Aly K.A, Abousehly A.M., Thin Solid Films, 515 (2007), 507. http://dx.doi.org/10.1016/j.tsf.2006.10.11810.1016/j.tsf.2006.10.118Search in Google Scholar

[28] Fayek S.A., Balboul M. R., Marzouk K.H., Thin Solid Films, 515 (2007) 7281. http://dx.doi.org/10.1016/j.tsf.2007.03.03910.1016/j.tsf.2007.03.039Search in Google Scholar

[29] Vlcek M., Frumar M., J. Non-Cryst. Solids, 97–98 (1987) 1223. http://dx.doi.org/10.1016/0022-3093(87)90292-410.1016/0022-3093(87)90292-4Search in Google Scholar

eISSN:
2083-134X
Language:
English
Publication timeframe:
4 times per year
Journal Subjects:
Materials Sciences, other, Nanomaterials, Functional and Smart Materials, Materials Characterization and Properties