Growth of Zn1−x CdxO nanocrystalline thin films by sol-gel method and their characterization for optoelectronic applications

[1] Ohta H., Hosono H., Mater. Today, 7 (2004), 42. http://dx.doi.org/10.1016/S1369-7021(04)00288-310.1016/S1369-7021(04)00288-3Search in Google Scholar

[2] Tang Z.K., Wong G.K.L., Yu P., Kawasaki M., Ohtomo A., Koinuma H., Segawa Y., Appl. Phys. Lett., 72(25) (1998), 3270. http://dx.doi.org/10.1063/1.12162010.1063/1.121620Search in Google Scholar

[3] Reddy K.T.R., Sravani C., Miles R.W., J. Cryst. Growth, 184–185 (1998), 1031. http://dx.doi.org/10.1016/S0022-0248(98)80215-710.1016/S0022-0248(98)80215-7Search in Google Scholar

[4] Park S.-H., Ryu J.-Y., Choi H.-H., Kwon T.-H., Sensor Actuat. B-Chem., 46(2) (1998), 75. http://dx.doi.org/10.1016/S0925-4005(97)00324-910.1016/S0925-4005(97)00324-9Search in Google Scholar

[5] Chung W.-Y., Sakai G., Shimanoe K., Miura N., Lee D.-D., Yamazoe N., Sensor Actuat. B-Chem., 46(2) (1998), 139. http://dx.doi.org/10.1016/S0925-4005(98)00100-210.1016/S0925-4005(98)00100-2Search in Google Scholar

[6] Sonawane B.K., Shelke V., Bhole M.P., Patil D.S., J. Phys. Chem. Solids, 72(12) (2011), 1442. http://dx.doi.org/10.1016/j.jpcs.2011.08.02210.1016/j.jpcs.2011.08.022Search in Google Scholar

[7] Mondal S., Kanta K.P., Mitra P., Journal of Physical Science, 12 (2008), 221. Search in Google Scholar

[8] Lieber C.M., Solid State Commun., 107 (1998), 607. http://dx.doi.org/10.1016/S0038-1098(98)00209-910.1016/S0038-1098(98)00209-9Search in Google Scholar

[9] Wang X.N., Wang Y., Mei Z.X., Dong J., Zeng Z.Q., Yuan H.T., Zhang T.C., Du X.L., Jia J.F., Xue Q.K., Zhang X.N., Zhang Z., Li Z.F., Lu W., Appl. Phys. Lett., 90(15) (2007), 151912. http://dx.doi.org/10.1063/1.272222510.1063/1.2722225Search in Google Scholar

[10] Ye J.D., Gu S.L., Zhu S.M., Qin F., Liu S.M., Liu W., Zhou X., Hu L.Q., Zhang R., Shi Y., Zheng Y.D., J. Appl. Phys., 96(9) (2004), 5308. http://dx.doi.org/10.1063/1.179175510.1063/1.1791755Search in Google Scholar

[11] Haga K., Suzuki T., Kashiwaba Y., Watanabe H., Zhang B.P., Segawa Y., Thin solid films, 433 (2003), 131. http://dx.doi.org/10.1016/S0040-6090(03)00327-410.1016/S0040-6090(03)00327-4Search in Google Scholar

[12] Vigil O., Vaillant L., Cruz F., Santana G., Morales-Acevedo A., Contreras-Puente G., Thin solid films, 361–362 (2000), 53. http://dx.doi.org/10.1016/S0040-6090(99)01061-510.1016/S0040-6090(99)01061-5Search in Google Scholar

[13] Ueda N., Maeda H., Hosono H., Kawazoe H., J. Appl. Phys., 84(11) (1998), 6174. http://dx.doi.org/10.1063/1.36893310.1063/1.368933Search in Google Scholar

[14] Lee S.Y., Li Y., Lee J.-S., Lee J.K., Nastasi M., Crooker S.A., Jia Q.X., Kang H.-S., Kang J.-S., Appl. Phys. Lett., 85(2) (2004), 218. http://dx.doi.org/10.1063/1.177181010.1063/1.1771810Search in Google Scholar

[15] Delgado G.T., Zuniga-Romero C.I., Sandoval O.J., Adv. Funct. Mater., 12 (2002), 129. http://dx.doi.org/10.1002/1616-3028(20020201)12:2<129::AID-ADFM129>3.0.CO;2-V10.1002/1616-3028(20020201)12:2<129::AID-ADFM129>3.0.CO;2-VSearch in Google Scholar

[16] Khan Z.R., Khan M.S., Zulfequar M., Khan M.S., Mater. Sci. Appl., 2(5) (2011), 340. 10.4236/msa.2011.25044Search in Google Scholar

[17] Maity R., Chattopadhyay K.K., Sol. Energ. Mat. Sol. C, 90 (2006), 597. http://dx.doi.org/10.1016/j.solmat.2005.05.00110.1016/j.solmat.2005.05.001Search in Google Scholar

[18] Singh A., Kumar D., Khanna P.K., Kumar M., Prasad B., ECS J. Solid State Sci. Technol., 2(9) (2013), Q136. http://dx.doi.org/10.1149/2.001309jss10.1149/2.001309jssSearch in Google Scholar

[19] Caglar Y., Caglar M., Ilican S., Ates A., J. Phys. D-Appl. Phys., 42 (2009), 065421. http://dx.doi.org/10.1088/0022-3727/42/6/06542110.1088/0022-3727/42/6/065421Search in Google Scholar

[20] Vijayalakshami S., Venkataraj S., Jayavel R., J. Phys. D-Appl. Phys., 41 (2008), 245403. http://dx.doi.org/10.1088/0022-3727/41/24/24540310.1088/0022-3727/41/24/245403Search in Google Scholar

[21] Zhang J., Zhao S.-Q., Zhang K., Zhou J.-Q., Cai Y.-F., Nanoscale Res. Lett., 7 (2012), 405. http://dx.doi.org/10.1186/1556-276X-7-40510.1186/1556-276X-7-405Search in Google Scholar

[22] Vanheusden K., Warren W.L., Seager C.H., Tallant D.R., Voigt J.A., Gnade B.E., J. Appl. Phys., 79(10) (1996), 7983. http://dx.doi.org/10.1063/1.36234910.1063/1.362349Search in Google Scholar

[23] Kohan A.F., Ceder G., Morgan D., Van De Walle C.G., Phys. Rev. B, 61(22) (2000), 15019. http://dx.doi.org/10.1103/PhysRevB.61.1501910.1103/PhysRevB.61.15019Search in Google Scholar