Role of substrate temperature on the growth mechanism and physical properties of spray deposited lead oxide thin films

[1] Kotz R., Stucky S., Carcer B., J. Appl. Electrochem., 21 (1991), 14. http://dx.doi.org/10.1007/BF0110382310.1007/BF01103823Search in Google Scholar

[2] Lipp L., Pletcher D., Electrochim. Acta, 42 (1997), 1091. http://dx.doi.org/10.1016/S0013-4686(96)00257-510.1016/S0013-4686(96)00257-5Search in Google Scholar

[3] Comninellis C., Pulgarin C., J. Appl. Electrochem., 23 (1993), 108. http://dx.doi.org/10.1007/BF0024694610.1007/BF00246946Search in Google Scholar

[4] Veluchamy P., Sharon M., Shimizu M., Minoura H., J. Electroanal. Chem., 365 (1994), 179. http://dx.doi.org/10.1016/0022-0728(93)02973-L10.1016/0022-0728(93)02973-LSearch in Google Scholar

[5] Ghasemi S., Mousavi M.F., Shamsipur M., Karami H., Ultrason. Sonochem., 15 (2008), 448. http://dx.doi.org/10.1016/j.ultsonch.2007.05.00610.1016/j.ultsonch.2007.05.00617644461Search in Google Scholar

[6] Zhang L., Guo F., Liu X., Cui J., Qian Y.T., J. Cryst. Growth., 280 (2005), 575. http://dx.doi.org/10.1016/j.jcrysgro.2005.03.07310.1016/j.jcrysgro.2005.03.073Search in Google Scholar

[7] Chao S., Fuang Y.F., Chen Y.C., Yan L., J. Phys. D Appl. Phys., 23 (1990), 955. http://dx.doi.org/10.1088/0022-3727/23/7/03210.1088/0022-3727/23/7/032Search in Google Scholar

[8] Madsen L.D., Weaver L., J. Am. Ceram. Soc., 81 (1998), 988. http://dx.doi.org/10.1111/j.1151-2916.1998.tb02436.x10.1111/j.1151-2916.1998.tb02436.xSearch in Google Scholar

[9] Bersani M., Morten B., Prudenziati M., J. Mater. Res., 12 (1997), 501. http://dx.doi.org/10.1557/JMR.1997.007210.1557/JMR.1997.0072Search in Google Scholar

[10] Trinquier G., Hoffmann R., J. Phys. Chem., 88 (1984), 6696. http://dx.doi.org/10.1021/j150670a03810.1021/j150670a038Search in Google Scholar

[11] Samoilenkov S.V., Adamov G.E., Gorbenko O.Y., Graboy I.E., Kaul A.R., Zandbergen H.W., Physica C, 338 (2000), 189. http://dx.doi.org/10.1016/S0921-4534(00)00301-410.1016/S0921-4534(00)00301-4Search in Google Scholar

[12] Neumayer D.A., Schulz D.L., Richeson D.S., Marks T.J., Degrout D.C., Schindler J.L., Kannewurf C.R., Thin Solid Films, 216 (1992), 41. http://dx.doi.org/10.1016/0040-6090(92)90866-A10.1016/0040-6090(92)90866-ASearch in Google Scholar

[13] Thangaraju B., Kaliannan P., Semicond. Sci. Tech., 15 (2000), 542. http://dx.doi.org/10.1088/0268-1242/15/6/30910.1088/0268-1242/15/6/309Search in Google Scholar

[14] Martos M., Morales J., Sanchez L., Ayouchi R., Leinen D., Martin F., RAMOS Barrado J.R., Electrochim. Acta, 46 (2001), 2939. http://dx.doi.org/10.1016/S0013-4686(01)00512-610.1016/S0013-4686(01)00512-6Search in Google Scholar

[15] Greenwood N.N., Earnshaw A., Chemistry of the Elements, 2nd ed., Butterworth Heinemann, Oxford, 2001. Search in Google Scholar

[16] Kim J.H., Kim Y., Chien A.T., Lange F.F., J. Mater. Res., 16 (2001), 1739. http://dx.doi.org/10.1557/JMR.2001.024010.1557/JMR.2001.0240Search in Google Scholar

[17] Baleva M., Tuncheva V., J. Mater. Sci. Lett., 13 (1994), 3. http://dx.doi.org/10.1007/BF0235290210.1007/BF02352902Search in Google Scholar

[18] Venkataraj S., Geurts J., Weis H., Jayavel R., Wuttig M., J. Vac. Sci. Technol. A, 19 (2001), 2870. http://dx.doi.org/10.1116/1.141094810.1116/1.1410948Search in Google Scholar

[19] Zhitomirsky I., Gal-Or L., Kohn A., Hennicke H.W., J. Mater. Sci. Lett., 14 (1995), 807. http://dx.doi.org/10.1007/BF0027813610.1007/BF00278136Search in Google Scholar

[20] Patil P.S., Mater. Chem. Phys., 59 (1999), 185. http://dx.doi.org/10.1016/S0254-0584(99)00049-810.1016/S0254-0584(99)00049-8Search in Google Scholar

[21] Ayouchi A., Martin M., Leinen D., Ramosbarrado J.R., J. Cryst. Growth, 247 (2003), 497. http://dx.doi.org/10.1016/S0022-0248(02)01917-610.1016/S0022-0248(02)01917-6Search in Google Scholar

[22] Kamal H., Elmaghraby E.K., Aly S.A., Abdelhady K., J. Cryst. Growth, 262(14) (2004), 424. http://dx.doi.org/10.1016/j.jcrysgro.2003.10.09010.1016/j.jcrysgro.2003.10.090Search in Google Scholar

[23] Chitra Agashe, Takwale M.G., Marathe B.R., Bhide V.G., Sol. Energ. Mat. Sol. C., 17 (1988), 99. http://dx.doi.org/10.1016/0165-1633(88)90010-X10.1016/0165-1633(88)90010-XSearch in Google Scholar

[24] Deokate R.J., Pawar S.M., Moholkar A.V., Sawant V.S., Pawar C.A., Bhosale C.H., Rajpure K.Y., Appl. Surf. Sci., 254 (2008), 2187. http://dx.doi.org/10.1016/j.apsusc.2007.09.00610.1016/j.apsusc.2007.09.006Search in Google Scholar

[25] Cruz M., Hernan L., Morales J., Sanchez L., J. Power Sources, 108 (2002), 35. http://dx.doi.org/10.1016/S0378-7753(02)00006-X10.1016/S0378-7753(02)00006-XSearch in Google Scholar

[26] Ma Ying-ren, J. Appl. Phys., 76 (1994), 2860. http://dx.doi.org/10.1063/1.35752210.1063/1.357522Search in Google Scholar

[27] Mahmoud S.A., Alshomer S., Tarawnh M.A., J. Mod. Phys., 2 (2011), 1178. http://dx.doi.org/10.4236/jmp.2011.21014710.4236/jmp.2011.210147Search in Google Scholar

[28] Radhakrishnan S., Kamalasanam M.N., Mahendru P.C., J. Mater. Sci., 18 (1983), 1912. http://dx.doi.org/10.1007/BF0055498210.1007/BF00554982Search in Google Scholar

[29] Arai T., J. Phys. Soc. Jpn., 15 (1960), 916. http://dx.doi.org/10.1143/JPSJ.15.91610.1143/JPSJ.15.916Search in Google Scholar

[30] Venkatara S., Geurts J., Weis H., Kappertz O., Njoroge W.K., Jayavel R., J. Vac. Sci. Technol. A, 19 (2001), 2870. http://dx.doi.org/10.1116/1.141094810.1116/1.1410948Search in Google Scholar

[31] Ohhyeon Hwang, Sangsu Kim, Jong Heesuh, Shinttang Cho, Kittyun Kim, Jinki Hong, Sunung Kim, Nucl. Instrum. Meth. A, 633 (2011), 569. Search in Google Scholar

[32] Salunkhe R.R., Dhawale D.S., Gujar T.P., Lokhande C.D., Mater. Res. Bull., 44 (2009), 364. http://dx.doi.org/10.1016/j.materresbull.2008.05.01010.1016/j.materresbull.2008.05.010Search in Google Scholar

[33] Ratheesh Kumar P.M., Sudhakartha C., Vijayakumar K.P., Singh F., Avasthi D.K., Abi T., Kashiwabe Y., Okram G.S., Kumar M., Sarveesh Kumar., J. Appl. Phys., 97 (2005), 013509. http://dx.doi.org/10.1063/1.182357410.1063/1.1823574Search in Google Scholar

[34] Singh R., Arora S.K., Singh J.P., Renu Tyagi, Agarwal S.K., Kanjilal D., Mater. Sci. Eng. BAdv., 86 (2001), 228. http://dx.doi.org/10.1016/S0921-5107(01)00707-310.1016/S0921-5107(01)00707-3Search in Google Scholar

[35] Khadeer Pasha S.K., Chidambaram K., Vijayan N., Madhuri W., Optoelectron. Adv. Mat., 6(1–2) (2012), 110. Search in Google Scholar