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Effect of substrate temperature on the electrical and optical properties of electron beam evaporated indium antimonide thin films


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[1] Mangal R.K., Vijay Y.K., Bull. Mater. Sci., 30 (2007) 117. http://dx.doi.org/10.1007/s12034-007-0021-x10.1007/s12034-007-0021-xSearch in Google Scholar

[2] Mangal R.K., Triapthi B., Singh M., Vijay Y.K., Rais A., Indian J. Pure & Applied Phys., 45 (2007) 987. Search in Google Scholar

[3] Mangal R.K., Vijay Y.K., Avatshi D.K., Shekher B.R., Indian J. Engineering & Materials Science, 14 (2007) 253. Search in Google Scholar

[4] Heremans J., Partin D.L., Thrush C.M., Semi Sci. Technol., 8 (1993) 424. http://dx.doi.org/10.1088/0268-1242/8/1S/09310.1088/0268-1242/8/1S/093Search in Google Scholar

[5] Carpenter M.K., Verbrugge M.W., J. Mater. Res., 9 (1994) 2584. http://dx.doi.org/10.1557/JMR.1994.258410.1557/JMR.1994.2584Search in Google Scholar

[6] Okamoto A., Yoshida T., Muramatsu S., Shibasaki I., J. Cryst. Growth, 201 (1999) 765. http://dx.doi.org/10.1016/S0022-0248(98)01466-310.1016/S0022-0248(98)01466-3Search in Google Scholar

[7] Udayshnakar N.K., Bhat H.L., Bull. Mater. Sci., 24, (2001) 445. http://dx.doi.org/10.1007/BF0270671410.1007/BF02706714Search in Google Scholar

[8] Zhang T., Clowes S.K., Debnath M., Bennett A., Roberts C., Harries J.J., Stradling R.A., Appl. Phys. Lett., 84, (2004) 22. http://dx.doi.org/10.1063/1.163743110.1063/1.1637431Search in Google Scholar

[9] Gaskill D.K., Stauf G.T., Bottka N., Appl. Phys. Lett., 58 (1991) 1905. http://dx.doi.org/10.1063/1.10506910.1063/1.105069Search in Google Scholar

[10] Taher A., Daffodil International University Journal of Science & Technology, 2 (2007), 39. Search in Google Scholar

[11] Holunes D.E., Kamnath G.S., J. Electron Mater., 9 (1980), 95. http://dx.doi.org/10.1007/BF0265521710.1007/BF02655217Search in Google Scholar

[12] Miyazaaki T., Kunugi M., Kitamure Y., Adachi S., Thin Solid Films, 287 (1996), 51. http://dx.doi.org/10.1016/S0040-6090(96)08738-X10.1016/S0040-6090(96)08738-XSearch in Google Scholar

[13] Vishwakarma S.R., Verma A.K., Tripathi R.S.N., Das S., Rahul, Indian J. Pure & Applied Phys., 50 (2012), 346. Search in Google Scholar

[14] Vishwakarma S.R., Verma A.K., Tripathi R.S.N., Rahul, Proc. Natl. Acad. Sci., India, Sect. A Phys. Sci., 82 (2012), 245, DOI: 10.1007/s40010-012-0031-y. http://dx.doi.org/10.1007/s40010-012-0031-y10.1007/s40010-012-0031-ySearch in Google Scholar

[15] Rahul, Verma A.K., Tripathi R.S.N., Vishwakarma S.R., Natl. Acad. Sci. Lett., DOI 10.1007/s40009-012-0060-8 (2012). Search in Google Scholar

[16] Tyagi M.S., Introduction to Semiconductor Materials & Devices, John Wiley & Sons, Inc (1991) 614. Search in Google Scholar

[17] Meehta C., Abass J., Saini G., Tripathi S., Chalcogenide Letter, 11 (2007), 133. Search in Google Scholar

[18] Singh M., Vijay Y.K., Indian Journal of Pure & Applied Physics, 42 (2004), 610. Search in Google Scholar

[19] Sze S.M., Physics of Semiconductor Devices, Ed.2, New Delhi, H.S. Poplai, Wiley Eastern Ltd, (1993) 31. Search in Google Scholar

[20] Okamoto A., Shibasaki I., Journal of Crystal Growth, 251 (2003), 560. http://dx.doi.org/10.1016/S0022-0248(02)02448-X10.1016/S0022-0248(02)02448-XSearch in Google Scholar

[21] Senthilkumar V., Venkatachalam S., Viswanath C., Wilson K.C., Vijay Kumar K.P., Cryst. Res. Technol., 40,6 (2005), 573. http://dx.doi.org/10.1002/crat.20041038510.1002/crat.200410385Search in Google Scholar

[22] Okamoto A., Ashihara A., Akaogi T., Shibasaki I., Journal of Crystal Growth, 227 (2001), 619. http://dx.doi.org/10.1016/S0022-0248(01)00784-910.1016/S0022-0248(01)00784-9Search in Google Scholar

[23] Ani S.K.J., Obaid Y.N., Kasim S.J., Mahdi M.A., Int. J. Nanoelectronics & Materials, 2 (2009), 109. Search in Google Scholar

[24] Singh S., Lal K., Srivastava A., Sood K., Kishore R., Indian Journal of Engineering & Material Sciences, 14 (2007), 55. Search in Google Scholar

eISSN:
2083-124X
ISSN:
2083-1331
Language:
English
Publication timeframe:
4 times per year
Journal Subjects:
Materials Sciences, other, Nanomaterials, Functional and Smart Materials, Materials Characterization and Properties