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Materials Science-Poland
Volume 29 (2011): Issue 2 (June 2011)
Open Access
(Bi2Te3)0:25(Sb2Te3)0:75 crystal structure improvements with excess Te as studied by AFM, SEM, EBSD and XRD
G. Kavei
G. Kavei
,
K. Ahmadi
K. Ahmadi
,
A. Shadmehr
A. Shadmehr
and
A. Kavei
A. Kavei
| Dec 27, 2011
Materials Science-Poland
Volume 29 (2011): Issue 2 (June 2011)
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Published Online:
Dec 27, 2011
Page range:
143 - 151
DOI:
https://doi.org/10.2478/s13536-011-0021-9
Keywords
structure homogeneity
,
intrinsic structure
,
Atomic Force Microscopy (AFM)
,
Scanning Electron Microscopy (SEM)
,
Electron Backscatter Diffraction (EBSD)
© 2011 Wroclaw University of Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.