Cite

1. Berry, R. W., Hall, P. M., & Harris, M. T. (1968). Thin film technology. New York: VanNostrand Reinhold.Search in Google Scholar

2. Hurman, R. W. (1975). U.S. Patent No. 3,988,582A. Nucleonic Data Systems, Inc.Search in Google Scholar

3. International Atomic Energy Agency. (2005). Technical data on nucleonic gauges. Vienna: IAEA. (IAEA–TECDOC-1459).Search in Google Scholar

4. BAL SEAL Engineering (2003). Metal plating processes and methods of measuring surface hardness and thickness coatings. Amsterdam: Bal Seal Engineering. (TR-105).Search in Google Scholar

5. Pocock, B. W. (1956). Application of beta-ray backscat-ter thickness gauge to traffic paint wear studies. In 2nd Pacific Area National Meeting of American Society for Testing Materials.Search in Google Scholar

6. Dakota Ultrasonics. (2008). Mmx-6 dl multi-mode ultrasonic thickness-meters. Operational Manual.Search in Google Scholar

7. Jaselskis, E. J., & Cackler, E. T. (2006). Using laser for real-time pavement thickness measurement. National Concrete Pavement Technology Center. (IHRB Project TR-538).Search in Google Scholar

8. Kiang, G. C., & Lee, L. (1969). Study of the coating thickness measurement by the method of filtering backscat-tered beta particles. Chinese J. Phys., 7(1), 2-8.Search in Google Scholar

9. Wang, Y. J., & Lee, S. H. (2007). Generalizing TOPSIS for fuzzy multiple-criteria group decision-making. Comput. Math. Appl., 53, 1762-1772.10.1016/j.camwa.2006.08.037Search in Google Scholar

10. 10. Hwang, C. L., & Yoon, K. L. (1981). Multiple attribute decision making. Methods and application. New York: Springer.10.1007/978-3-642-48318-9Search in Google Scholar

11. Katz, L., & Penfold, A. S. (1952). Range-energy relations for electrons and the determination of beta-ray end-point energies by absorption. Rev. Mod. Phys., 24, 28-44.10.1103/RevModPhys.24.28Search in Google Scholar

12. Lapp, K. E., & Andrews, H. L. (1948). Nuclear radiation physics. New York: Prentice-Hall Inc.Search in Google Scholar

13. Sharma, K. K., & Singh, M. (1980). Z-dependence of thick target β-ray backscattering. J. Appl. Phys., 51, 2239-2243.10.1063/1.327848Search in Google Scholar

14. Cember, H., & Johnson, T. E. (2009). Introduction to health physics (4th ed.). New York: McGraw-Hill Medical.Search in Google Scholar

15. Mahajan, C. S. (2012). Mass attenuation coefficients of beta particles in elements. Science Research Reporter, 2(2), 135-141.Search in Google Scholar

16. Thummel, H. W. (1974). Durschgang von elektronen und betastrahlung durch materieschichten. Berlin: Akademie–Verlag.10.1515/9783112575161Search in Google Scholar

17. Sharma, K. K., & Singh, M. (1979). Variation of beta-ray backscattering with target thickness. J. Appl. Phys., 50, 1529-1534.10.1063/1.326141Search in Google Scholar

18. Everhart, T. E. (1960). Simple theory concerning the reflection of electrons from solids. J. Appl. Phys., 31, 1483-1490.10.1063/1.1735868Search in Google Scholar

19. Archard, G. D. (1961). Back scattering of electrons. J. Appl. Phys., 32, 1505-1510.10.1063/1.1728385Search in Google Scholar

20. Briesmeister, J. F. (2000). MCNP - A general Monte Carlo N-particle transport code. (Version 4C). Los Alamos, NM: Los Alamos National Laboratory. (LA-13709-M).Search in Google Scholar

21. Frujinoiu, C., & Brey, R. R. (2001). A Monte Carlo investigation on electron backscattering. Radiat. Prot. Dosim., 97, 223-229.10.1093/oxfordjournals.rpd.a00666711843337Search in Google Scholar

22. Saremi, M., Mousavi, S. F., & Sanayei, A. (2009). TQM consultant in SMEs with TOPSIS under fuzzy environment. (Vol. 36, pp. 2742-2749).10.1016/j.eswa.2008.01.034Search in Google Scholar

23. Zadeh, L. A. (1965). Fuzzy sets. Inform. Control, 8, 333-353.10.1016/S0019-9958(65)90241-XSearch in Google Scholar

24. Zimmermann, H. J. (1991). Fuzzy sets theory and its application. Dordrecht: Kluwer Academic Press.10.1007/978-94-015-7949-0Search in Google Scholar

25. Deng, H., Yeh, C. H., & Willis R. J. (2000). Inter-company comparison using modified TOPSIS with objective weights. Comput. Oper. Res., 27, 963-973.10.1016/S0305-0548(99)00069-6Search in Google Scholar

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