Cite

[1] Kamal H., Elmaghraby K.E., Ali A.S., Abdelhady K., J. Cryst. Growth, 262 (2004), 424.10.1016/j.jcrysgro.2003.10.090Search in Google Scholar

[2] He J., Lindstrom H., Hagfeldt A., Lindquist E.S., J. Phys. Chem. B, 103 (1999), 8940.10.1021/jp991681rSearch in Google Scholar

[3] Yoshimura K., Miki T., Tanemura S., Jpn. J. Appl. Phys., 34 (1995), 2440.10.1143/JJAP.34.2440Search in Google Scholar

[4] Liu K., Anderson M., J. Electrochem. Soc., 143 (1966), 124.10.1149/1.1836396Search in Google Scholar

[5] Hotovy I., Rehacek V., Siciliano P., Capone S., Spiess L., Thin Solid Films, 418 (2002), 9.10.1016/S0040-6090(02)00579-5Search in Google Scholar

[6] Cook G.J., Koffyberg P.F., Sol. Energ. Mater., 10 (1984), 55.10.1016/0165-1633(84)90008-XSearch in Google Scholar

[7] Makkus C.R., Hemmes K., Wit D.W.H.J., J. Electrochem. Soc., 141 (1994), 3429.10.1149/1.2059349Search in Google Scholar

[8] Chan M.I., Hsu Y.T., Hong C.F., Appl. Phys. Lett., 81 (2002), 1899.10.1063/1.1505112Search in Google Scholar

[9] Derakhshi M., Jamali T., Elyasi M., Bijad M., Sadeghi R., Kamali A., Niazazari K., Shahmiri R.M., Bhari A., Mokhtari S., Int. J. Electrochem. Sc., 8 (2013), 8252.Search in Google Scholar

[10] Khansari A., Enhessari M., Niasari S.M., J. Clust. Sci., 24 (2013), 289.10.1007/s10876-012-0521-8Search in Google Scholar

[11] Alagiri M., Ponnusamy S., Muthamizhchelvan C., J. Mater. Sci. Mater. El., 23 (2012), 728.10.1007/s10854-011-0479-6Search in Google Scholar

[12] Jahromi P.S., Huang M.N., Muhamad R.M., Lim N.H., Ceram. Int., 39 (2013), 3909.10.1016/j.ceramint.2012.10.237Search in Google Scholar

[13] Mallick P., Rath C., Biswal R., Mishra C.N., Mishra C.N., Indian J. Phys., 83 (2009), 517.10.1007/s12648-009-0012-4Search in Google Scholar

[14] Alias S.S., Ismail B.A., Mohamad A.A., J. Alloy. Compd., 499 (2010), 231.10.1016/j.jallcom.2010.03.174Search in Google Scholar

[15] Jenkins R., Snyder L.R., Introduction to X-ray Powder Diffractometry, John Wiley & Sons, New Jersey, 1996.10.1002/9781118520994Search in Google Scholar

[16] Comini E., Faglia G., Sberveglieri G., Pan Z., Wang L.W., Appl. Phys. Lett., 81 (2012), 1869.10.1063/1.1504867Search in Google Scholar

[17] Aliahmad M., Noori M., Indian J. Phys., 87 (2013), 43.10.1007/s12648-013-0246-zSearch in Google Scholar

[18] Zorkipli M.N.N., Kaus M.H.N., Mohamad A.A., Procedia Chem., 19 (2016), 626.10.1016/j.proche.2016.03.062Search in Google Scholar

[19] Gandhi C.A., Cheng H.-Y., Chang Y.-M., Lin G.J., Mater. Res. Express, 3 (3) (2016), 035017.10.1088/2053-1591/3/3/035017Search in Google Scholar

[20] El-Kamray M., Nagy N., El-Mehasseb I., Mat. Sci. Semicon. Proc., 16 (6) (2013), 1747.10.1016/j.mssp.2013.05.018Search in Google Scholar

[21] Nassar N.N., Hassan A., Almao P.P., Appl. Catal. A-Gen., 462 – 463 (2013), 116.10.1016/j.apcata.2013.04.033Search in Google Scholar

[22] Kalam A., Al-Shihri S.A., Shakir M., Elbindary A.A., Yousef S.E., Du G., Synth. React. Inorg. M., 41 (2011), 1324.10.1080/15533174.2011.609213Search in Google Scholar

[23] Al-Sehemi G.A., Al-Shihri S.A., Kalam S.A., Du G., Ahmad T., J. Mol. Struct., 1058 (2014), 56.10.1016/j.molstruc.2013.10.065Search in Google Scholar

[24] Anandan K., Rajendran V., IJNN., 2 (4) (2012), 24.Search in Google Scholar

[25] Mendoza-Galvan A., Vidales-Hurtado A., Lopez-Beltran M.A., Thin Solid Films, 517 (2009), 3115.10.1016/j.tsf.2008.11.094Search in Google Scholar

[26] Makhlouf A.S., Kaseem A.M., Abdel-Rahim A.M., Optoelectron. Adv. Mat., 4 (2010), 1562.Search in Google Scholar

[27] Zatsepin F.A., Kuznetsova A.Y., Sokolov I.V., J. Lumin., 183 (2017), 135.10.1016/j.jlumin.2016.11.006Search in Google Scholar

[28] Mcgill C.T., Collins A.D., Semicond. Sci. Tech., 8 (1993), Sl.10.1088/0268-1242/8/1S/001Search in Google Scholar

[29] Wang X.-L., Dou X.S., Zhang C., NPG Asia Mater., 2 (2010), 31.10.1038/asiamat.2010.7Search in Google Scholar

[30] Ahmed T., Ramanujachary V.K., Lofland E.S., Ganguli K.A., Solid State Sci., 8 (2006), 425.10.1016/j.solidstatesciences.2005.12.005Search in Google Scholar

[31] Lu A.H., Salabas E.L., Schuth F., Angew. Chem. Int. Edit., 46 (2007), 1222.10.1002/anie.20060286617278160Search in Google Scholar

[32] Mourdikoudis S., Simeonidis K., Vilaltaclemente A., Tuna F., Tsiaoussis I., Angelakeris M., Dendrinou-Samara C., Kalogirou O., J. Magn. Magn. Mater., 321 (2009), 2723.10.1016/j.jmmm.2009.03.076Search in Google Scholar

[33] Gandhi C.A., Lin G.J., J. Magn. Magn. Mater., 424 (2017), 221.10.1016/j.jmmm.2016.10.034Search in Google Scholar

[34] Lima A.T.A., Dantas L.A., Almeida S.N., J. Magn. Magn. Mater., 425 (2017), 72.10.1016/j.jmmm.2016.10.124Search in Google Scholar

[35] Nadeem K., Ullah A., Mushtaq M., Kamran M., Hussain S.S., Mumtaz M., J. Magn. Magn. Mater., 417 (2016), 6.10.1016/j.jmmm.2016.05.064Search in Google Scholar

[36] Dave S.R., Gao X.H., WIRES Nanomed. Nanobi., 1 (2009), 583.10.1002/wnan.5120049819Search in Google Scholar

eISSN:
2083-134X
Language:
English
Publication timeframe:
4 times per year
Journal Subjects:
Materials Sciences, other, Nanomaterials, Functional and Smart Materials, Materials Characterization and Properties