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Materials Science-Poland
Volume 36 (2018): Issue 3 (September 2018)
Open Access
Use of scanning area related multiple degradation profiles for AFM assessment of polystyrene/PC
61
BM nanocomposite surface deterioration
Andrzej Sikora
Andrzej Sikora
,
Magdalena Moczała
Magdalena Moczała
and
Bartosz Boharewicz
Bartosz Boharewicz
| Nov 02, 2018
Materials Science-Poland
Volume 36 (2018): Issue 3 (September 2018)
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Published Online:
Nov 02, 2018
Page range:
397 - 402
Received:
Mar 27, 2017
Accepted:
Jun 12, 2018
DOI:
https://doi.org/10.2478/msp-2018-0071
Keywords
atomic force microscopy
,
surface roughness
,
precise positioning
,
surface degradation
,
polystyrene nanocomposite
© 2018 Andrzej Sikora et al., published by Sciendo
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.
Andrzej Sikora
Electrotechnical Institute, Division of Electrotechnology and Materials Science,
Wrocław, Poland
Magdalena Moczała
Electrotechnical Institute, Division of Electrotechnology and Materials Science,
Wrocław, Poland
Bartosz Boharewicz
Electrotechnical Institute, Division of Electrotechnology and Materials Science,
Wrocław, Poland