Login
Register
Reset Password
Publish & Distribute
Publishing Solutions
Distribution Solutions
Subjects
Publications
Journals
Books
Proceedings
Publishers
Blog
Contact
Search
Cart
EUR
USD
GBP
English
English
Deutsch
Polski
Español
Français
Italiano
Home
Journals
Journal of Artificial Intelligence and Soft Computing Research
Volume 9 (2019): Issue 1 (January 2019)
Open Access
A MLMVN with Arbitrary Complex-Valued Inputs and a Hybrid Testability Approach for the Extraction of Lumped Models Using FRA
Igor Aizenberg
Igor Aizenberg
,
Antonio Luchetta
Antonio Luchetta
,
Stefano Manetti
Stefano Manetti
and
Maria Cristina Piccirilli
Maria Cristina Piccirilli
| Aug 20, 2018
Journal of Artificial Intelligence and Soft Computing Research
Volume 9 (2019): Issue 1 (January 2019)
About this article
Previous Article
Next Article
Abstract
References
Authors
Articles in this Issue
Preview
PDF
Cite
Share
Published Online:
Aug 20, 2018
Page range:
5 - 19
Received:
May 28, 2017
Accepted:
Oct 19, 2017
DOI:
https://doi.org/10.2478/jaiscr-2018-0021
Keywords
Analog circuits
,
Complex-valued neural networks
,
Lumped models
,
Testability
© 2019 Igor Aizenberg et al., published by Sciendo
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.
Igor Aizenberg
Manhattan College,
New York
Antonio Luchetta
Dept. of Information Engineering, University of Florence
Firenze, Italy
Stefano Manetti
Dept. of Information Engineering, University of Florence
Firenze, Italy
Maria Cristina Piccirilli
Dept. of Information Engineering, University of Florence
Firenze, Italy