High transparency and conductivity of heavily In-doped ZnO thin films deposited by dip-coating method

[1] Lim J.H., Kang C.K., Kim K.K., Park I.K., Hwang D.K., Park S.J., Adv. Mater., 18 (2006), 2720.10.1002/adma.200502633Search in Google Scholar

[2] Park Y.J., Song H., Ko K.B., Ryu B.D., Cuong T.V., Hong C.H., J. Nanomater., 2016 (2016), ID 7947623 (6).10.1155/2016/7947623Search in Google Scholar

[3] Djessas K., Bouchama I., Gauffier J.L., Benayadi Z., Thin Solid Films, 555 (2014), 28.10.1016/j.tsf.2013.08.109Search in Google Scholar

[4] Syu Y.K., Tingare Y., Lin S.Y., Yeh C.Y., Wu J.J., Molecules, 21 (2016), 1025.10.3390/molecules21081025627390427527136Search in Google Scholar

[5] Dilonardo E., Penza M., Alvisi M., Difranco C., Palmisano F., Torsi L., Cioffi N., Beilstein J. Nanotechnol., 7 (2016), 22.10.3762/bjnano.7.3473442626925349Search in Google Scholar

[6] Saidani T., Zaabat M., Aida M.S., Boudine B., Superlattice. Microst., 88 (2015), 315.10.1016/j.spmi.2015.09.029Search in Google Scholar

[7] Dobrucka R., Długaszewska J., Saudi J. Biol. Sci., 23 (2016), 517.10.1016/j.sjbs.2015.05.016489019527298586Search in Google Scholar

[8] Cadafal CH., Gazquez G., Lei S., George A., Gullapalli H., Boukamp B.A., Ajayan P.M., Ten Elshof J.E., ACS Appl. Mater. Interfaces, 21 (2016), 13466.10.1021/acsami.6b0159427173007Search in Google Scholar

[9] Liu J., Fernandez-Serra M.V., Allen P.A., Phys. Rev. B, 93 (2016), 081205(R).10.1103/PhysRevB.93.081205Search in Google Scholar

[10] Wang Z.L., MRS Bull., 37 (2012), 814.10.1557/mrs.2012.186Search in Google Scholar

[11] Boruah B.D., Misra A., ACS Appl. Mater. Interfaces, 8 (2016), 18182.10.1021/acsami.6b0495427352008Search in Google Scholar

[12] Jin Z., Zhou Q., Chen Y., Mao P., Li H., Liu H., Wang J., Yuliang L., Adv. Mater., 28 (2016), 3697.10.1002/adma.20160035427007327Search in Google Scholar

[13] Liu H., Avrutin V., Izyumskaya N., Özgür Ü., Morkoç H., Superlattice. Microst., 48 (2010), 458.10.1016/j.spmi.2010.08.011Open DOISearch in Google Scholar

[14] Jun M.C., Park S.U., Koh J.H., Nanoscale Res. Lett., 7 (2012), 639.10.1186/1556-276X-7-639357045823173885Search in Google Scholar

[15] Minami T., Sato H., Nanto H., Takata S., Jpn. J. Appl. Phys., 24 (1985), L781.10.1143/JJAP.24.L781Search in Google Scholar

[16] Liu C., Masuda Y., Wu Y, Takai O., Thin Solid Films, 503 (2006), 110.10.1016/j.tsf.2005.12.075Search in Google Scholar

[17] Yang J.H., Zheng J.H., Zhai H.J., Yang L.L., Liu L., Gao M., Cryst. Res. Technol., 44 (2009), 619.10.1002/crat.200800633Open DOISearch in Google Scholar

[18] Kou H., Jia L., Wang C., Carbon, 50 (2012), 3522.10.1016/j.carbon.2012.03.020Search in Google Scholar

[19] Wu X., Qu F., Zhang X., Cai W., Shen G., J. Alloy. Compd., 486 (2009), 13.10.1016/j.jallcom.2009.06.197Search in Google Scholar

[20] Li F., Ding Y., Gao P., Xin X., Wang Z.L., Angew. Chem. Int. Ed., 43 (2004), 5238.10.1002/anie.20046078315455417Search in Google Scholar

[21] Shen G.Z., Bando Y., Liu B.D., Golberg D., Lee C.J., Adv. Funct. Mater., 16 (2006), 410.10.1002/adfm.200500571Open DOISearch in Google Scholar

[22] Feng X.Y., Wang Z., Zhang C.W., Wang P.J., Physica E, 54 (2013), 144.10.1016/j.physe.2013.05.027Open DOISearch in Google Scholar

[23] Waugh M.R., Hyett G., Parkin I.P., Chem. Vap. Depos., 14 (2008), 366.10.1002/cvde.200806718Search in Google Scholar

[24] Umar A., Karunagaran B., Suh E.K., Hahn Y.B., Nanotechnology, 17 (2006), 4072.10.1088/0957-4484/17/16/013Open DOISearch in Google Scholar

[25] Park T.E., Kim D.C., Kong B.H., Cho H.K., J. Korean Phys. Soc., 45 (2004), S0697.Search in Google Scholar

[26] Lehraki N., Aida M.S., Abed S., Attaf N., Poulain M., Curr. Appl. Phys., 12 (2012), 1283.10.1016/j.cap.2012.03.012Search in Google Scholar

[27] Bao D., Gu H., Kuang A., Thin Solid Films, 312 (1998), 37.10.1016/S0040-6090(97)00302-7Search in Google Scholar

[28] Hafdallah A., Yanineb F., Aida M.S., Attaf N., J. Alloy. Compd., 509 (2011), 7267.10.1016/j.jallcom.2011.04.058Search in Google Scholar

[29] Lim S.Y., Brahma S., Liu C.P., Wang R.C., Huang J.L., Thin Solid Films, 549 (2013), 165.10.1016/j.tsf.2013.09.001Search in Google Scholar

[30] Chen K.J., Hung F.Y., Chang S.J., Hu Z.S., Appl. Surf. Sci., 255 (2009), 6308.10.1016/j.apsusc.2009.02.007Search in Google Scholar

[31] Caglar M., Ilican S., Caglar Y., Thin Solid Films, 517 (2009), 5023.10.1016/j.tsf.2009.03.037Search in Google Scholar

[32] Lee S.Y., Park B.O., Thin Solid Films, 484 (2005), 184.10.1016/j.tsf.2005.03.007Search in Google Scholar

[33] Saidani T., Zaabat M., Aida M.S., Barille R., Almohamed Y., J. Mater. Electron., 28 (2017), 9252.10.1007/s10854-017-6660-9Open DOISearch in Google Scholar

[34] Saidani T., Zaabat M., Aida M.S., Benaboud A., Benzitouni S., Boudine A., Superlattice. Microst., 75 (2014), 47.10.1016/j.spmi.2014.07.015Search in Google Scholar

[35] Powder Diffraction File Data Card 5-644, 3cPDS International Center for Diffraction Data, Swartmore, PA.Search in Google Scholar

[36] Thambidurai M., Kim J.Y., Kang C.M., Muthukumarasamy N., Song H.J., Song J., Ko Y, Velauthapillai D., Lee C., Renew. Energy, 66 (2014), 433.10.1016/j.renene.2013.12.031Open DOISearch in Google Scholar

[37] Nolan M.G., Hamilton J.A., Brien S.O, Bruno G., Pereirad L., Fortunatod E., J. Photochem. Photobiol. A Chem., 219 (2011), 10.Search in Google Scholar

[38] Ramamoorthy K., Kumar K., Chandramohan R., Sankaranarayanana K., Saravanan R., Kityk I.V., Ramasamy P., Opt. Commun., 262 (2006), 91.10.1016/j.optcom.2005.12.042Search in Google Scholar

[39] Kaur G., Mitra A., Yadav K.L., Mater. Int., 25 (2015), 12.10.1016/j.pnsc.2015.01.012Search in Google Scholar

[40] Hoggas K., Nouveau C., Djelloul A., Bououdina M., Appl. Phys. A, 120 (2015), 745.10.1007/s00339-015-9252-7Search in Google Scholar

[41] Forouhi A.R., Bloomer I., Phys. Rev. B, 34 (1986), 7018.10.1103/PhysRevB.34.7018Open DOISearch in Google Scholar

[42] Pankove J.I., Optical Processes in Semiconductors, Prentice Hall Inc., Englewood Cliffs, New Jersey, 1971.Search in Google Scholar

[43] Tauc J., Amorphous and Liquid Semiconductors, Plenum Press, New York, 1974.10.1007/978-1-4615-8705-7Search in Google Scholar

[44] O’Leary S.K., Zukotynski S., Perz J.M., J. Non- Cryst. Solids, 210 (1997), 249.10.1016/S0022-3093(96)00612-6Search in Google Scholar

[45] Park Y. R., Kim E. K., Jung D., Park T. S., Kim Y.S., Appl. Surf. Sci., 254 (2008), 2250.10.1016/j.apsusc.2007.09.008Search in Google Scholar

[46] Chen K.J., Fang T.H., Hung F.Y., Ji L.W., Chang S.J., Young S.J., Hsiao Y.J., Appl. Surf. Sci., 254 (2008), 5791.10.1016/j.apsusc.2008.03.080Search in Google Scholar

[47] Benouis C.E., Benhaliliba M., Juarez A.S., Aida M.S., Chamid F., Yakuphanoglue F., J. Alloy. Compd., 490 (2010), 62.10.1016/j.jallcom.2009.10.098Search in Google Scholar

[48] Benhaliliba M., Benouis C.E., Mouffak Z., Ocak Y.S., Tiburci O., Silver A., Aida M.S., Garcia A.A., Tavira A., Sanchez Juarez A., Superlattice. Microst., 63 (2013), 228.10.1016/j.spmi.2013.09.010Open DOISearch in Google Scholar