Login
Register
Reset Password
Publish & Distribute
Publishing Solutions
Distribution Solutions
Subjects
Architecture and Design
Arts
Business and Economics
Chemistry
Classical and Ancient Near Eastern Studies
Computer Sciences
Cultural Studies
Engineering
General Interest
Geosciences
History
Industrial Chemistry
Jewish Studies
Law
Library and Information Science, Book Studies
Life Sciences
Linguistics and Semiotics
Literary Studies
Materials Sciences
Mathematics
Medicine
Music
Pharmacy
Philosophy
Physics
Social Sciences
Sports and Recreation
Theology and Religion
Publications
Journals
Books
Proceedings
Publishers
Blog
Contact
Search
EUR
USD
GBP
English
English
Deutsch
Polski
Español
Français
Italiano
Cart
Home
Journals
Materials Science-Poland
Volume 34 (2016): Issue 4 (December 2016)
Open Access
AFM studies of pits formation on KBr(1 0 0) during its dissolution by water
Justyna Pers
Justyna Pers
,
Bogdan Barwiński
Bogdan Barwiński
,
Miłosz Grodzicki
Miłosz Grodzicki
and
Antoni Ciszewski
Antoni Ciszewski
| Nov 27, 2016
Materials Science-Poland
Volume 34 (2016): Issue 4 (December 2016)
About this article
Previous Article
Next Article
Abstract
Article
Figures & Tables
References
Authors
Articles in this Issue
Preview
PDF
Cite
Share
Published Online:
Nov 27, 2016
Page range:
863 - 867
Received:
Apr 20, 2016
Accepted:
Sep 23, 2016
DOI:
https://doi.org/10.1515/msp-2016-0108
Keywords
dissolution
,
stepwave model
,
screw dislocation
,
KBr
,
AFM
© Wroclaw University of Technology.
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.
(a) Horizontal derivatives of a KBr(1 0 0) surface just after crystal cleaving; AFM in-the-air imaging, (b) the area of the square 6.1 × 6.1 pm2 marked with the dashed line in (a).
Evolution of the etch pit versus exposure to a weak isopropanol solution of water. Exposure time in minutes is given in the upper right corner of each image. Area of scan is 9.0 × 9.0 µm2. Z scales of images (a-e) are described from dark (0 nm) to light 38, 39, 32, 36 and 25 nm, respectively.
Hollow profiles along directions (a) [0 1 0] and (b) [1 1 0] for various times of exposure to the solution. Inset in (a) shows crystallographic directions of the hollow.
(a) Number of atomic steps and (b) base side width of the etched hollow as a function of time along 〈1 1 0〈 and 〈1 0 0〉 directions.
Density of atomic steps as a function of time along 〈1 1 0〉 and 〈1 0 0〉 directions.
Influence of tip scanning on the shape of a hollow. Profiles along [1 1 0] and [1 1 0] directions were observed in 203 minutes of exposure to the solution.