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Materials Science-Poland
Volume 34 (2016): Issue 4 (December 2016)
Open Access
Investigations of optical and surface properties of Ag single thin film coating as semitransparent heat reflective mirror
J. Domaradzki
J. Domaradzki
,
D. Kaczmarek
D. Kaczmarek
,
M. Mazur
M. Mazur
,
D. Wojcieszak
D. Wojcieszak
,
J. Halarewicz
J. Halarewicz
,
S. Glodek
S. Glodek
and
P. Domanowski
P. Domanowski
| Dec 23, 2016
Materials Science-Poland
Volume 34 (2016): Issue 4 (December 2016)
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Published Online:
Dec 23, 2016
Page range:
747 - 753
Received:
Jan 14, 2016
Accepted:
Sep 05, 2016
DOI:
https://doi.org/10.1515/msp-2016-0102
Keywords
optical coating
,
optical properties
,
heat reflective mirror
,
surface analysis
© Wroclaw University of Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.
Spectral characteristics of: (a) transmission and (b) reflection coefficients designed for Ag thin films with different thicknesses.
Dependence of transmission and reflection coefficients on thin film thickness estimated for λ=550 nm.
Transmission and reflection characteristics of 15 nm silver thin films deposited on glass by electron beam evaporation. Theoretical curves were designed using Film Star Design software.
Temperature changes measured at the back surface of a reference and 15 nm Ag coated glass under exposition to heat radiation from quartz-halogen lamp.
Transmission and reflection spectra of the 15 nm Ag thin film coating after exposition to heat radiation.
SEM images of the surface of: a) as-deposited and b) annealed 15 nm Ag thin films prepared by electron beam evaporation
EDS spectra of annealed Ag thin films taken from marked areas.
AFM images taken at different magnifications for: a) as-deposited and b) heated Ag thin films.
AFM analysis results: a) height distribution of grains size in Z direction and b) cross-section topography of as-deposited and heated Ag thin films.
XPS spectra of as-deposited and annealed Ag thin films: a) wide scan survey spectrum, b) Ag3d, c) O1s and d) Si2p, Ag3s regions.