Investigation of the impact of simulated solar radiation on the micro- and nanoscale morphology and mechanical properties of a sheet moulded composite surface

[1]Loos J., Adv. Mat., 17 (15) (2005), 1821.LoosJ.Adv. Mat17152005182110.1002/adma.200500701Search in Google Scholar

[2]Malinauskas M., Zukauskas A., Belazaras K., Tikuisis K., Purlys V., Gadonas R., Piskarskas A., Eur. Phys. J.-Appl. Phys., 58 (2012), 20501.MalinauskasM.ZukauskasA.BelazarasK.TikuisisK.PurlysV.GadonasR.PiskarskasA.Eur. Phys. J.-Appl. Phys5820122050110.1051/epjap/2012110475Search in Google Scholar

[3]Salas O., Kearns K., Carrera S., Moore J.J., Surf. Coat. Tech., 172 (2-3) (2003), 117.SalasO.KearnsK.CarreraS.MooreJ.J.Surf. Coat. Tech1722-3200311710.1016/S0257-8972(03)00322-0Search in Google Scholar

[4]Soltani P., Johari M.S., Zarrebini M., Powder Technol., 254 (2014), 44.SoltaniP.JohariM.S.ZarrebiniM.Powder Technol25420144410.1016/j.powtec.2014.01.001Search in Google Scholar

[5]Falat T., Matkowski P., Platek B., Zandén C., Felba J., Ye L.-L., Liu J., EMPC 2013, 2013 (2013), 1.FalatT.MatkowskiP.PlatekB.ZandénC.FelbaJ.YeL.-L.LiuJ.EMPC 2013201320131Search in Google Scholar

[6]Suresh B., Maruthamuthu S., Khare A., Palanisamy N., Muralidharan V.S., Ragu-nathan R., Kannan M., Pandiyaraj K.N., J. Polym. Res., 18 (6) (2011), 2175.SureshB.MaruthamuthuS.KhareA.PalanisamyN.MuralidharanV.S.Ragu-nathanR.KannanM.PandiyarajK.N.J. Polym. Res1862011217510.1007/s10965-011-9628-0Search in Google Scholar

[7]Nowicki M., Richter A., Wolf B., Kacz-Marek H., Polymer, 44 (21) (2003), 6599.NowickiM.RichterA.WolfB.Kacz-MarekH.Polymer44212003659910.1016/S0032-3861(03)00729-8Search in Google Scholar

[8]Robertson C., Wertheimer M., Fournier D., Lamarre L., IEEE T. Dielec. El. In., 3 (2) (1996), 283.RobertsonC.WertheimerM.FournierD.LamarreL.IEEE T. Dielec. El. In32199628310.1109/94.486780Search in Google Scholar

[9]Minoshima K., Oie Y., Komai K., ISIJ Int., 43 (4) (2003), 579.MinoshimaK.OieY.KomaiK.ISIJ Int434200357910.2355/isijinternational.43.579Search in Google Scholar

[10]Wu J., Zhao M., Nguyen T., Gu X., Mater. Res. Soc. Symp. Proc., 1056 (2008), 227.WuJ.ZhaoM.NguyenT.GuX.Mater. Res. Soc. Symp. Proc1056200822710.1557/PROC-1056-HH08-34Search in Google Scholar

[11]Proff C., Abolhassan S., Dadras M.M., Lemaignan C., J. Nucl. Mater., 404 (2010), 97.ProffC.AbolhassanS.DadrasM.M.LemaignanC.J. Nucl. Mater40420109710.1016/j.jnucmat.2010.05.012Search in Google Scholar

[12]Sikora A., Meas. Sci. Technol., 25 (2014), 055401.SikoraA.Meas. Sci. Technol25201405540110.1088/0957-0233/25/5/055401Search in Google Scholar

[13]Sikora A., Optica Appl., 43 (1) (2013), 163.SikoraA.Optica Appl431201316310.3917/ethn.131.0163Search in Google Scholar

[14]Garcia R., Perez R., Surf. Sci. Rep., 47 (2002), 197.GarciaR.PerezR.Surf. Sci. Rep47200219710.1016/S0167-5729(02)00077-8Search in Google Scholar

[15]Sikora A., Bednarz L., Przeglad Elektrotechniczny, 11a/2010 (2010), 207.SikoraA.BednarzL.Przeglad Elektrotechniczny11a/20102010207Search in Google Scholar

[16]Sikora A., Bednarz L., Cent. Eur. J. Phys., 9 (2) (2011), 372.SikoraA.BednarzL.Cent. Eur. J. Phys92201137210.1007/978-3-476-00063-7_140Search in Google Scholar

[17]Butt H.-J., Cappella B., Kappl M., Surf. Sci. Rep., 59 (1-6) (2005), 1.ButtH.-J.CappellaB.KapplM.Surf. Sci. Rep591-62005110.1016/j.surfrep.2005.08.003Search in Google Scholar

[18]Sikora A., Iwan A., High Perform. Polym., 24 (3) (2012), 218.SikoraA.IwanA.High Perform. Polym243201221810.1177/0954008311436220Search in Google Scholar

[19]Standard ISO/DIS 25178-2 ASME B46.1.Standard ISO/DIS 25178-2ASMEB46.1Search in Google Scholar

[20]http://www.imagemet.com, accessed 25.11.2015.http://www.imagemet.comaccessed 25.11.2015Search in Google Scholar

[21]Vincent O.R.F.O, InSITE 2009, 2009 (2009), 97VincentO.R.F.OInSITE 20092009200997Search in Google Scholar

[22]Iwan A., Boharewicz B., Tazbir I., Sikora A., Schab-Balcerzak E., Grucela-Zajac M., Sko-Rka L., Synthetic Met., 189 (2014), 183.IwanA.BoharewiczB.TazbirI.SikoraA.Schab-BalcerzakE.Grucela-ZajacM.Sko-RkaL.Synthetic Met189201418310.1016/j.synthmet.2014.01.016Search in Google Scholar

[23]Iwan A., Boharewicz B., Parafiniuk K., Tazbir I., Gorecki L., Sikora A., Filapek M., Schab-Balcerzak E., Synthetic Met., 195 (2014), 341.IwanA.BoharewiczB.ParafiniukK.TazbirI.GoreckiL.SikoraA.FilapekM.Schab-BalcerzakE.Synthetic Met195201434110.1016/j.synthmet.2014.07.004Search in Google Scholar

[24]Chuchmała A., Palewicz M., Sikora A., Iwan A., Synthetic Met., 169 (2013), 33.ChuchmałaA.PalewiczM.SikoraA.IwanA.Synthetic Met16920133310.1016/j.synthmet.2013.03.006Search in Google Scholar

[25]http://www.imagemet.com/WebHelp6/Default.htm#RoughnessParameters/Roughness_Parameters.htm, accessed 25.11.2015.http://www.imagemet.com/WebHelp6/Default.htm#RoughnessParameters/Roughness_Parameters.htmaccessed 25.11.2015Search in Google Scholar

[26]Derjaguin B. V., Muller V. M., Toporov Y.U.P., J. Colloid Interf. Sci., 53 (1975), 314.DerjaguinB.V.MullerV. M.ToporovY.U.P.J. Colloid Interf. Sci53197531410.1016/0021-9797(75)90018-1Search in Google Scholar

[27]Ekwińska M., Rymuza Z., Microelectron. Eng., 87 (2010), 1404.EkwińskaM.RymuzaZ.Microelectron. Eng872010140410.1016/j.mee.2009.11.159Search in Google Scholar

[28]http://www.brukerafmprobes.com/p-3249-ddesp-10.aspx, accessed 25.11.2015.http://www.brukerafmprobes.com/p-3249-ddesp-10.aspxaccessed 25.11.2015Search in Google Scholar

[29]Ozimek M., Sikora A., Wilczyński W., Przeglqd Elektrotechniczny, 89 (8) (2013), 208.OzimekM.SikoraA.WilczyńskiW.Przeglqd Elektrotechniczny8982013208Search in Google Scholar