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Synthesis of PVDF/SBT composite thin films by spin coating technology and their ferroelectric properties


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Fig. 1

XRD patterns of the x-SBT/PVDF films (x =0 %, 5 %, 10%, 15 %, 20 %) on Si substrate: (a) full spectra; (b) partial spectra with amplification image (diffraction angle from 18° to 25°).
XRD patterns of the x-SBT/PVDF films (x =0 %, 5 %, 10%, 15 %, 20 %) on Si substrate: (a) full spectra; (b) partial spectra with amplification image (diffraction angle from 18° to 25°).

Fig. 2

FT-IR spectra of the x-SBT/PVDF films (x = 0 %, 5 %, 10 %, 15 %, 20 %) on ITO coated glass substrate.
FT-IR spectra of the x-SBT/PVDF films (x = 0 %, 5 %, 10 %, 15 %, 20 %) on ITO coated glass substrate.

Fig. 3

Frequency dependence of the relative dielectric constant of the x-SBT/PVDF(x = 0 %, 5 %, 10 %, 15 %, 20 %) films on ITO coated glass substrate measured at room temperature.
Frequency dependence of the relative dielectric constant of the x-SBT/PVDF(x = 0 %, 5 %, 10 %, 15 %, 20 %) films on ITO coated glass substrate measured at room temperature.

Fig. 4

Electric hysteresis loops of the x-SBT/PVDF (x = 0 %, 5 %, 10 %, 15 %, 20 %) films on ITO coated glass substrate.
Electric hysteresis loops of the x-SBT/PVDF (x = 0 %, 5 %, 10 %, 15 %, 20 %) films on ITO coated glass substrate.

Fig. 5

I-V characteristics of the x-SBT/PVDF (x = 0 %, 5 %, 10 %, 15 %, 20 %) films on ITO coated glass substrate.
I-V characteristics of the x-SBT/PVDF (x = 0 %, 5 %, 10 %, 15 %, 20 %) films on ITO coated glass substrate.
eISSN:
2083-134X
Language:
English
Publication timeframe:
4 times per year
Journal Subjects:
Materials Sciences, other, Nanomaterials, Functional and Smart Materials, Materials Characterization and Properties