Fabrication and properties of zinc oxide thin film prepared by sol-gel dip coating method

[1] WAKEHAM J.S., THWAITES J.M., HOLTON W.B., TSAKONAS C., CRANTON M.W., KOUTSOGEORGIS C.D., RANSON R., Thin Solid Films, 518 (2009), 1355 10.1016/j.tsf.2009.04.072Search in Google Scholar

[2] SHIN H.S., SHIN H.J., PARK J.K., ISHIDA T., TABATA O., KIM H.H., Thin Solid Films, 341 (1999), 225.10.1016/S0040-6090(98)01531-4Search in Google Scholar

[3] MURALI R.K., J. Phys. Chem. Solids, 68 (2007), 2293.10.1016/j.jpcs.2007.06.006Search in Google Scholar

[4] KANEVA N.V., DUSHKIN C.D., Bulg. Chem. Commun., 43 (2011), 259.Search in Google Scholar

[5] CHENG X.L., ZHAO H., HUO L.H., GAO S., ZHAO J.G., Sensor. Actuat. B-Chem., 102 (2004), 248.10.1016/j.snb.2004.04.080Search in Google Scholar

[6] KLEIN C.L., Sol-gel technology for thin films, fibres, performs, electronics, and specialty shapes, Noyes Publications, New Jersey, 1988.Search in Google Scholar

[7] LOPEZ M.T., AVNIR D., AEGERTER M., Emerging fields in sol-gel science and technology, Kluwer Academic Publishers, London, 2003.10.1007/978-1-4615-0449-8Search in Google Scholar

[8] KAYANI N.Z., AFZAL T., RIAZ S., NASEEM S., J. Alloy.Compd., 606 (2014), 177.10.1016/j.jallcom.2014.04.039Search in Google Scholar

[9] ANNA K., NINA P., YURI K., MEINHARD M., WERNER Z., AHARON G., Ultrason. Sonochem., 15 (2008), 839.10.1016/j.ultsonch.2007.10.01118191608Search in Google Scholar

[10] LI H., WANG J., LIU H., YANG C., XU H., LI X., CUI H., Vacuum, 77 (2004), 57.10.1016/j.vacuum.2004.08.003Search in Google Scholar

[11] WAHAB R., ANSARI S.G., KIM Y.S., SEO H.K., SHIN H.S., Appl. Surf. Sci., 253 (2007), 7622.10.1016/j.apsusc.2007.03.060Search in Google Scholar

[12] ALIAS S.S., ISMAIL A.B., MOHAMAD A.A., J. Alloy.Compd., 499 (2010), 231.10.1016/j.jallcom.2010.03.174Search in Google Scholar

[13] KHAN R.Z., KHAN S.M., ZULFEQUAR M., KHAN S.M., Mater. Sci. Appl., 2 (2011), 340.10.4236/msa.2011.25044Search in Google Scholar

[14] OHYAMA M., KOZUKA H., YOKO T., Thin Solid Films, 306 (1997), 78.10.1016/S0040-6090(97)00231-9Search in Google Scholar

[15] MANIFACIER C., GASIOT J., FILLARD J., J. Phys. E, 9 (1976), 1002.10.1088/0022-3735/9/11/032Search in Google Scholar

[16] URBACH F., Phys. Rev., 92 (1953), 1324.10.1103/PhysRev.92.1324Search in Google Scholar

[17] TAN T.S., CHEN J.B., SUN W.X., FAN J.W., J. Appl.Phys., 98 (2005), 013505.10.1063/1.1940137Search in Google Scholar

[18] BALASUBRAMANIAN V., SURIYANARAYANAN N., KANNAN R., Res. J. Chem. Sci., 2 (2012), 51.Search in Google Scholar

[19] SHINDE S.M., AHIRRAO B.P., PATIL J.I., PATIL S.R., Indian J. Pur. Ap. Phy., 50 (2012), 657.Search in Google Scholar

[20] OZTA M., Chinese Phys. Lett., 25 (2008), 4090. 10.1088/0256-307X/25/11/069Search in Google Scholar