Cite

[1] WILLEY R., Practical production of thin films, Vol. 1, Willey Optical, Consultants, Charleviox, 2008.Search in Google Scholar

[2] YANG Y.-C., CHANG C.-T., HSIAO Y.-C., LEE J.-W., LOU B.-S., Surf. Coat. Tech., 259 (2014), 219.10.1016/j.surfcoat.2014.05.028Search in Google Scholar

[3] LIN J., MOORE J.J., SPROUL W.D., MISHRA B., WUA Z., WANG J., Surf. Coat. Tech., 204 (2010), 2230.10.1016/j.surfcoat.2009.12.013Search in Google Scholar

[4] HSIAO Y.-C., LEE J.-W., YANG Y.-C., LOU B.-S., Thin Solid Films, 549 (2013), 281.10.1016/j.tsf.2013.08.059Search in Google Scholar

[5] KACZMAREK D., DOMARADZKI J., WOJCIESZAK D., PROCIOW E., MAZUR M., PLACIDO F., LAPP S., J. Nano Res.-Sw., 18 - 19 (2012), 195.10.4028/www.scientific.net/JNanoR.18-19.195Search in Google Scholar

[6] MAZUR M., SIERADZKA K., KACZMAREK D., DOMARADZKI J., WOJCIESZAK D., DOMANOWSKI P., PROCIOW E., Mater. Sci.-Poland, 31 (3) (2013), 434.10.2478/s13536-013-0122-8Search in Google Scholar

[7] DOMARADZKI J., KACZMAREK D., PROCIOW E.L., BORKOWSKA A., SCHMEISSER D., BEUCKERT G., Thin Solid Films, 513 (1 - 2) 2006, 269.10.1016/j.tsf.2006.01.049Search in Google Scholar

[8] KACZMAREK D., PROCIOW E.L., DOMARADZKI J., BORKOWSKA A., MIELCAREK W., WOJCIESZAK D., Mater. Sci.-Poland, 26 (1) (2008), 113.Search in Google Scholar

[9] PAMU D., GHANASHYAM M., RAJU K.C., BHATNAGAR A.K., Solid State Commun., 135 (1 - 2) (2005), 7.10.1016/j.ssc.2005.04.003Search in Google Scholar

[10] GAO F.M., GAO L.H., J. Superhard Mater.+, 32 (3) (2010), 148.10.3103/S1063457610030020Search in Google Scholar

[11] KULIKOVSKY V., CTVRTLIK R., VORLICEK V., FILIP J., BOHAC P., JASTRABIK L., Thin Solid Films, 542 (2013), 91.10.1016/j.tsf.2013.06.070Search in Google Scholar

[12] L¨OBL P., HUPPERTZ M., MERGEL D., Thin Solid Films, 251 (1994), 72.10.1016/0040-6090(94)90843-5Search in Google Scholar

[13] MODES T., SCHEFFEL B., METZNER C., ZYWITZKI O., REINHOLD T.E., Surf. Coat. Tech., 200 (2005), 306.10.1016/j.surfcoat.2005.02.080Search in Google Scholar

[14] OKIMURA K., SHIBATA A., MAEDA N., TACHIBANA K., NOGUCHI Y., TSUCHIDA K., Jpn. J. Appl. Phys., 43 (1995) 4950.10.1143/JJAP.34.4950Search in Google Scholar

[15] GU G.-R., LI Y.-A., TAO Y.-C., HE Z., LI J.-J., YIN H., LI W.-Q., ZHAO Y.-N., Vacuum, 71 (2003), 487.10.1016/S0042-207X(03)00048-4Search in Google Scholar

[16] ZEMAN P., TAKABAYASHI S., Surf. Coat. Tech., 153 (2002), 93.10.1016/S0257-8972(01)01553-5Search in Google Scholar

[17] JOUANNY I., LABDI S., AUBERT P., BUSCEMA C., MACIEJAK O., BERGER M.-H., GUIPONT V., JEANDIN M., Thin Solid Films, 518 (2010), 3212.10.1016/j.tsf.2009.09.046Search in Google Scholar

[18] ZYWITZKI O., MODES T., SAHM H., FRACH P., GOEDICKE K., GL¨OSS D., Surf. Coat. Tech., 180 - 181 (2004), 538.10.1016/j.surfcoat.2003.10.115Search in Google Scholar

[19] KONSTANTINIDIS S., DAUCHOT J.P., HECQ M., Thin Solid Films, 515 (2006), 1182.10.1016/j.tsf.2006.07.089Search in Google Scholar

[20] STRANAK V., QUAAS M., WULFF H., HUBICKA Z., WREHDE S., TICHY M., HIPPLER R., J. Phys. D Appl. Phys., 41 (2008), 055202.10.1088/0022-3727/41/5/055202Search in Google Scholar

[21] BENDAVID A., MARTIN P.J., TAKIKAWA H., Thin Solid Films, 360 (2000), 241.10.1016/S0040-6090(99)00937-2Search in Google Scholar

[22] SUDA Y., KAWASAKI H., UEDA T., OHSHIMA T., Thin Solid Films, 453 - 454 (2004), 162.10.1016/j.tsf.2003.11.185Search in Google Scholar

[23] CHUANG L.-C., LUO C.-H., YANG S., Appl. Surf. Sci., 258 (2011), 297.10.1016/j.apsusc.2011.08.055Search in Google Scholar

[24] DUYAR O., PLACIDO F., DURUSOY H.Z., J. Phys. D Appl. Phys., 41 (2008), 095307.10.1088/0022-3727/41/9/095307Search in Google Scholar

[25] GAO F., Phys. Rev. B, 73 (2006), 132104.10.1103/PhysRevB.73.132104Search in Google Scholar

[26] LIANG Y., ZHANG B., ZHAO J., Phys. Rev. B, 77 (2008), 094126.10.1103/PhysRevE.77.05660218643181Search in Google Scholar

[27] MAYO M.J., SIEGEL R.W., NARAYANASAMY A., NIX W.D., J. Mater. Res., 5 (5) (1990), 1073.10.1557/JMR.1990.1073Search in Google Scholar

[28] SCHMIDT-STEIN F., THIEMANN S., BERGER S., HAHN R., SCHMUKI P., Acta Mater., 58 (2010), 6317.10.1016/j.actamat.2010.07.053Search in Google Scholar

[29] JUNG H., PARK C., LEE J., PARKY. S., Mater. Res. Bull., 58 (2014), 44.Search in Google Scholar

[30] JIMENEZ PIQUE E., GONZALEZ-GARCIA L., RICO V.J., GONZALEZ-ELIPE A.R., Thin Solid Films, 550 (2014), 444.10.1016/j.tsf.2013.10.022Search in Google Scholar

[31] WU K.-R., TING C.-H., WANG J.-J., LIU W.-C., LIN C.-H., Surf. Coat. Tech., 200 (2006), 6030.10.1016/j.surfcoat.2005.09.031Search in Google Scholar

[32] KRISHNA D.S.R., SUN Y., CHEN Z., Thin Solid Films, 519 (2011), 4860.10.1016/j.tsf.2011.01.042Search in Google Scholar

[33] DOMARADZKI J., KACZMAREK D., ADAMIAK B., DORA J., MAGUDA S., Polish Patent Application, P 395 346, 2011.Search in Google Scholar

[34] KLUG H.P., ALEXANDER L.E., X-ray Diffraction Procedures for Polycrystalline and Amorphous Materials, 2nd edition, John Wiley and Sons, New York, 1974.Search in Google Scholar

[35] OLIVER W.C., PHARR G.M., J. Mater. Res., 7 (1992), 1564.10.1557/JMR.1992.1564Search in Google Scholar

[36] OLIVER W.C., PHARR G.M., J. Mater. Res., 10 (2004), 3.10.1557/jmr.2004.19.1.3Search in Google Scholar

[37] FISCHER-CRIPPS A.C., Nanoindentation, Mechanical Engineering Series, Springer-Verlag, New York, 2002.10.1007/978-0-387-22462-6Search in Google Scholar

[38] JUNG Y.G., LAWN B.R., MARTYNIUK M., HUANG H., HU X.Z., J. Mater. Res., 19 (2004), 3076.10.1557/JMR.2004.0380Search in Google Scholar

[39] ROY S., Int. J. Fracture, 144 (2007), 21.10.1007/s10704-007-9072-7Search in Google Scholar

[40] KARIMPOUR M., Comp. Mater. Sci., 68 (2013), 384.10.1016/j.commatsci.2012.11.007Search in Google Scholar

[41] KATARIA S., Thin Solid Films, 522 (2012), 297.10.1016/j.tsf.2012.09.001Search in Google Scholar

[42] Powder Diffraction File, Joint Committee on Powder Diffraction Standards, Philadelphia, PA: ASTM; 1967 Card 21-1272.Search in Google Scholar

[43] Powder Diffraction File. Joint Committee on Powder Diffraction Standards. Philadelphia, PA: ASTM; 1967Card 21-1276. Search in Google Scholar

eISSN:
2083-134X
Language:
English
Publication timeframe:
4 times per year
Journal Subjects:
Materials Sciences, other, Nanomaterials, Functional and Smart Materials, Materials Characterization and Properties