Effect of substrate temperature on structural and optical properties of spray deposited ZnO thin films

[1] AMBIA M.G., ISLAM M.N., OBAIDUL HAKIM M., Sol. Ener. Mat. Sol. C., 28 (2) (1992), 103.10.1016/0927-0248(92)90002-7Search in Google Scholar

[2] GOYAL D.J., AGASHE C., TAKWALE M.G., MARATHE B.R., BHIDE V.G., J. Mater. Sci., 27 (17) (1992), 4705.10.1007/BF01166010Search in Google Scholar

[3] BAKHA Y., BENDIMERAD K.M., HAMZAOUI S., Eur.Phys. J. - Appl. Phys., 55 (2011), 30103.10.1051/epjap/2011110072Search in Google Scholar

[4] FAY S., SHAH A., Zinc Oxide Grown by CVD Process as Transparent Contact for Thin Film Solar Cell Applications, in: ELLMER K., KLEIN A., RECH B., (Eds.) Transparent Conductive Zinc Oxide. Basics and Applications in Thin Film Solar Cells, Springer Series in Materials Science, Vol. 104, Springer Berlin Heidelberg, 2008, pp. 235 - 302.10.1007/978-3-540-73612-7_6Search in Google Scholar

[5] BOUDERBALA M., HAMZAOUI S., STAMBOULI A.B., BOUZIANE H., Appl. Energ., 64 (1 - 4) (1999), 89.10.1016/S0306-2619(99)00047-1Search in Google Scholar

[6] ZHANG X.-A., ZHANG J.-W., ZHANG W.-F., WANG D., BI Z., BIAN X.-M., HOU X., Thin Solid Films, 516 (10) (2008), 3305.10.1016/j.tsf.2007.09.034Search in Google Scholar

[7] KAMALASANAN M.N., CHANDRA S., Thin Solid Films, 288 (1 - 2) (1996), 112.10.1016/S0040-6090(96)08864-5Search in Google Scholar

[8] OLVERA DE LA M.L., MALDONADO A., VEGA PEREZ J., SOLORZA-FERIA O., Mater. Sci. Eng. BAdv., 174 (1 - 3) (2010), 42.10.1016/j.mseb.2010.03.074Search in Google Scholar

[9] DUTTA V., Energy Procedia, 3 (2011), 58.10.1016/j.egypro.2011.01.010Search in Google Scholar

[10] VIMALKUMAR T.V., POORNIMA N., SUDHA KARTHA C., VIJAYAKUMAR K.P., Appl. Surf. Sci., 256 (20) (2010), 6025.10.1016/j.apsusc.2010.03.113Search in Google Scholar

[11] ASHOUR A., KAID M.A., EL-SAYED N.Z., IBRAHIM A.A., Appl. Surf. Sci., 252 (22) (2006), 7844.10.1016/j.apsusc.2005.09.048Search in Google Scholar

[12] BANERJEE A.N., GOSH C.K., CHATTOPADHYA K.K., MINOURA H., SARKAR A.K., AKIBA A., KAMIYA A., ENDO T., Thin Solid Films, 496 (1) (2006), 112.10.1016/j.tsf.2005.08.258Search in Google Scholar

[13] KIM H.W., KIM N.H., LEE C., RYU J.H., LEE N.E., J. Korean Phys. Soc., 44 (2004), 14.Search in Google Scholar

[14] MA T.Y., KIM S.H., MOON H.Y., PARK G.C., KIM Y.J., KIM K.W., Jpn. J. Appl. Phys., 35 (1996), 6208.10.1143/JJAP.35.6208Search in Google Scholar

[15] FAN X.M., LIAN J.S., GUO Z.X., LU H.J., J. Cryst. Growth, 279 (2005), 447.10.1016/j.jcrysgro.2005.02.065Search in Google Scholar

[16] BANERJEE A.N., GHOSH C.K., CHATTOPADHYAY K.K., MINOURA H., SARKAR A.K., AKIBA A., KAMIYA A., ENDO T., Thin Solid Films, 496 (2006), 112.10.1016/j.tsf.2005.08.258Search in Google Scholar

[17] DIKOVSKA A.O., ATANASOV P.A., VASILEV C., DIMITROV I.G., STOYANCHOV T.R., J. Optoelectron. Adv. M., 7 (2005), 1329.Search in Google Scholar

[18] SCHERRER P., Nachr. Ges. Wiss. Göttingen, 2 (1918), 96.Search in Google Scholar

[19] SCHRODER D.K., Semiconductor Material and Device Characterization, Wiley, New York, 1990.Search in Google Scholar

[20] CULLITY B.D., Elements of X-ray Diffraction, Addison-Wesley, Reading, MA, 1978, p. 102.Search in Google Scholar

[21] PRASADA RAO T., SANTHOSH KUMAR M.C., ANBUMOZHI ANGAYARKANNI S., ASHOK M., J. Alloy. Compd., 485 (1 - 2) (2009), 413.10.1016/j.jallcom.2009.05.116Search in Google Scholar

[22] ILICAN S., CAGLAR M., CAGLAR Y., Mater. Sci.- Poland, 25 (2007), 715.Search in Google Scholar

[23] CRACIUN V., PERRIERE J., BASSIM N., SINGH R.K., CRACIUN D., SPEAR J., Appl. Phys. A, 25 (1999), 531. 10.1007/s003390051463Search in Google Scholar