<abstract xmlns="http://www.w3.org/1999/xhtml"><p>The present research is devoted to creation of a new low-cost miniaturised measurement system for determination of potential difference in real time and with high measurement resolution. Furthermore, using the electrode of the reference probe, Kelvin method leads to both an indirect measurement of electronic work function or contact potential of the sample and measurement of a surface potential for insulator type samples. The bucking voltage in this system is composite and comprises a periodically variable component. The necessary steps for development of signal processing and tracking are described in detail.</p></abstract>

The present research is devoted to creation of a new low-cost miniaturised measurement system for determination of potential difference in real time and with high measurement resolution. Furthermore, using the electrode of the reference probe, Kelvin method leads to both an indirect measurement of electronic work function or contact potential of the sample and measurement of a surface potential for insulator type samples. The bucking voltage in this system is composite and comprises a periodically variable component. The necessary steps for development of signal processing and tracking are described in detail.

Determination of Contact Potential Difference by the Kelvin Probe (Part II) 2. Measurement System by Involving the Composite Bucking Voltage

Institute of Solid State Physics, University of Latvia, 8 Kengaraga Street, Riga, LV-1063,

Institute of Physical Energetics, 11 Krivu Street, LV-1006, Riga,

Latvian Journal of Physics and Technical Sciences

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

The present research is devoted to creation of a new low-cost miniaturised measurement system for determination of potential difference in real time and with...

Determination of Contact Potential Difference by the Kelvin Probe (Part II) 2. Measurement System by Involving the Composite Bucking Voltage

Published Online: Jan 25, 2017

Page range: 57 - 66

DOI: https://doi.org/10.1515/lpts-2016-0045

Keywords
Kelvin probe, contact potential difference, surface potential

© 2016 O. Vilitis et al., published by De Gruyter Open

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

Determination of Contact Potential Difference by the Kelvin Probe (Part II) 2. Measurement System by Involving the Composite Bucking Voltage

Published Online: Jan 25, 2017

Page range: 57 - 66

DOI: https://doi.org/10.1515/lpts-2016-0045

KeywordsKelvin probe, contact potential difference, surface potential

© 2016 O. Vilitis et al., published by De Gruyter Open

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

Keywords
Kelvin probe, contact potential difference, surface potential