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Journals
International Journal of Applied Mathematics and Computer Science
Volume 26 (2016): Issue 3 (September 2016)
Open Access
Automatic parametric fault detection in complex analog systems based on a method of minimum node selection
Adrian Bilski
Adrian Bilski
and
Jacek Wojciechowski
Jacek Wojciechowski
| Sep 29, 2016
International Journal of Applied Mathematics and Computer Science
Volume 26 (2016): Issue 3 (September 2016)
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Published Online:
Sep 29, 2016
Page range:
655 - 668
Received:
Oct 24, 2014
Accepted:
Mar 09, 2016
DOI:
https://doi.org/10.1515/amcs-2016-0045
Keywords
complex analog systems
,
support vector machine
,
tabu search
,
genetic algorithm
,
parametric fault detection
© 2016 Adrian Bilski et al., published by De Gruyter Open
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.
Adrian Bilski
Faculty of Applied Informatics and Mathematics, Warsaw University of Life Sciences—SGGW, ul. Nowoursynowska 159, 02-776 Warsaw, Poland
Jacek Wojciechowski
Institute of Radioelectronics, Warsaw University of Technology, ul. Nowowiejska 15/19, 00-665 Warsaw, Poland