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Comparison of Two Techniques of Pattern Recognition in the Image Analysis-Based Wheat Stalk Length Characterization


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Jan Thore Benthien
Thünen Institute of Wood Research, Hamburg, Germany
Sabrina Heldner
Thünen Institute of Wood Research, Hamburg, Germany
Benjamin Seppke
Cognitive Systems Laboratory, Department of Informatics, MIN Faculty, University of HamburgHamburg, Germany
Jan Hörbelt
Faculty of Life Sciences, Rhine-Waal University of Applied SciencesKleve, Germany