Inhomogeneities in the Structure of High Temperature Superconducting Layer

Superconducting layer in coated conductor was investigated to assess the inhomogeneities present in its structure and to get better insight into the effect of inhomogeneities on degradation of electric properties. In the investigation scanning electron microscopy, energy-dispersive X-ray spectroscopy, electron backscattered diffraction, and laser scanning confocal microscopy were used. The results obtained showed good correlation between the density of inhomogeneities across the tape width and the degradation of current transport properties determined by measurements of the current density