High-Temperature X-Ray Diffraction and Fluorescence Spectra of SnSe Single Crystal

Abstract

The temperature dependence of unit cell parameters was studied using high-temperature X-ray diffraction and the coefficient of thermal expansion of SnSe single crystal was determined. Fluorescence spectra of SnSe single crystal grown by the Bridgman-Stockbarger method were examined using a Cary Eclipse spectrophotometer at room temperature in the wavelength range 200–900 nm. When the samples were irradiated by a pulse at a wavelength of 230 nm, the fluorescence spectra exhibited maxima at wavelengths 313.07, 423.03, 458.93, 495.07, and 530.00 nm.

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