Enhancement of XPS surface sensitivity in nanocrystalline material
The influence of the particle size on the surface sensitivity in XPS analysis was investigated. Previous reports about such influence were qualitatively only. In this report there are given mathematical description of XPS sensitivity and quantitative results. It was found that influence due to nanometric size on XPS analysis can be noticeable for particles below 15 nm of diameter and increases dramatically with reduction of the size.
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Tougaard S. (2005). XPS for Quantitative Analysis of Surface Nano-structures. Microsc. Microanal. 11(2) 676-677. DOI:10.1017/S1431927605500229.
Jablonski A. & Powell C. J. (2004). Electron effective attenuation lengths in electron spectroscopies J. Alloy. Compd. 362 26-32. DOI:10.1016/S0925-8388(03)00558-9.
Gunter P. L. J. (1992). Evaluation of take-off-angle-dependent XPS for determining the thickness of passivation layers on aluminium and silicon. Surf Interface Anal. 19 161-164. DOI: 10.1002/sia.740190131.
Suchorski Y. Wrobel R. Becker S. Opalinska A. Narkiewicz U. Podsiadly M. & Weiss H. (2008). Surface chemistry of zirconia nanopowders doped with Pr2O3: an XPS study Acta Phys Pol A 114 125 0150 134.
Briggs D. (2005). Surface analysis of polymers by XPS and static SIMS Cambridge Solid State Science Series Cambridge University Press.