Enhancement of XPS surface sensitivity in nanocrystalline material

Open access

Enhancement of XPS surface sensitivity in nanocrystalline material

The influence of the particle size on the surface sensitivity in XPS analysis was investigated. Previous reports about such influence were qualitatively only. In this report there are given mathematical description of XPS sensitivity and quantitative results. It was found that influence due to nanometric size on XPS analysis can be noticeable for particles below 15 nm of diameter and increases dramatically with reduction of the size.

If the inline PDF is not rendering correctly, you can download the PDF file here.

  • Tougaard S. (2005). XPS for Quantitative Analysis of Surface Nano-structures. Microsc. Microanal. 11(2) 676-677. DOI:10.1017/S1431927605500229.

  • Jablonski A. & Powell C. J. (2004). Electron effective attenuation lengths in electron spectroscopies J. Alloy. Compd. 362 26-32. DOI:10.1016/S0925-8388(03)00558-9.

  • Gunter P. L. J. (1992). Evaluation of take-off-angle-dependent XPS for determining the thickness of passivation layers on aluminium and silicon. Surf Interface Anal. 19 161-164. DOI: 10.1002/sia.740190131.

  • Suchorski Y. Wrobel R. Becker S. Opalinska A. Narkiewicz U. Podsiadly M. & Weiss H. (2008). Surface chemistry of zirconia nanopowders doped with Pr2O3: an XPS study Acta Phys Pol A 114 125 0150 134.

  • Briggs D. (2005). Surface analysis of polymers by XPS and static SIMS Cambridge Solid State Science Series Cambridge University Press.

Journal information
Impact Factor

IMPACT FACTOR 2018: 0.975
5-year IMPACT FACTOR: 0.878

CiteScore 2018: 1

SCImago Journal Rank (SJR) 2018: 0.269
Source Normalized Impact per Paper (SNIP) 2018: 0.46

All Time Past Year Past 30 Days
Abstract Views 0 0 0
Full Text Views 226 36 0
PDF Downloads 108 47 0