Published Online: Dec 28, 2010
Page range: 62 - 63
DOI: https://doi.org/10.2478/v10026-010-0052-8
Keywords
This content is open access.
The influence of the particle size on the surface sensitivity in XPS analysis was investigated. Previous reports about such influence were qualitatively only. In this report there are given mathematical description of XPS sensitivity and quantitative results. It was found that influence due to nanometric size on XPS analysis can be noticeable for particles below 15 nm of diameter and increases dramatically with reduction of the size.