Influence of sintering temperature on secondary phases formation and microwave dielectric properties of Ca2Ce2Ti5O16 ceramics

Ca2Ce2Ti5O16 dielectric ceramics prepared by conventional solid-state ceramic route was investigated. Phase composition and microwave dielectric properties were measured using XRD and Vector network analyzer, respectively. XRD analysis of the calcined and sintered samples revealed the formation of CeO2 and another unidentified phase (that vanished at ≥ 1400 °C) as secondary phases along with the parent Ca2Ce2Ti5O16 phase. The amount of the parent Ca2Ce2Ti5O16 phase increased with increasing sintering temperature from 1350 °C to 1450 °C accompanied by a decrease in the apparent density. The density decreased but ɛr and Qu f o increased with sintering temperature. An er ~ 81.5, Qu fo ~5915 GHz and t f ~ 219 GHz were achieved for the sample sintered at 1450 °C.