Metrology and Measurement Systems

The Journal of Committee on Metrology and Scientific Instrumentation of Polish Academy of Sciences

Open access

The aim of the journal is to enhance the world-wide exchange of information on the advancements in the field of measurement sciences and technology, with particular focus on the areas where the activity of other metrology-related journals is insufficient. The main priority is given to supporting the young researchers in their scientific development – by publishing research results recorded in their Ph.D. and D.Sc. theses. Fostering of publication activities in the countries of Central and Eastern Europe is also an important element of the journal's mission. The substance-related priority is given to IT-based measurement methods and techniques, especially to DSP-based, AI-based and wireless instrumentation.
More information: on website

Why subscribe and read

Metrology and Measurement Systems is an international journal, issued quarterly under auspices of the Polish Academy of Sciences. It is a peer-reviewed journal, launched in 1988, since 2001 it appears in English. Actually is edited both in paper and electronic format. The journal is source of high quality information from research, development and applications of measurement sciences and technology. Over 20 years of experience in publishing original paper dealing with various measurement methods and instrumentations applied in many field of engineering and medicine.

Why submit

  • Wide and important for research and engineering activity list of topics covered by the journal: general principles of measurement, measurement of physical, chemical and biological quantities, medical measurements, sensors and transducers, measurement data acquisition, measurement signal transmission and processing, measurement systems and microsystems, internet-based and wireless-communication-based measurements, virtual and AI-based instruments, design and manufacture of instruments.
  • Fair and constructive peer review.
  • Short publication cycle – average 6 months.
  • Free language assistance for authors from non-English speaking regions.

Similarity Check Plagiarism Screening System

The editorial board is participating in a growing community of Similarity Check System's users in order to ensure that the content published is original and trustworthy. Similarity Check is a medium that allows for comprehensive manuscripts screening, aimed to eliminate plagiarism and provide a high standard and quality peer-review process.

Detailed description of the Similarity Check System can be found at:

Supplementary Materials

Abstracting & Indexing

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Janusz Smulko, Gdansk University of Technology, Poland

International Programme Committee
Andrzej ZAJĄC, Chairman, Military University of Technology, Poland
Bruno ANDO, University of Catania, Italy
Martin BURGHOFF, Physikalisch-Technische Bundesanstalt, Germany
Marcantonio CATELANI, University of Florence, Italy
Numan DURAKBASA, Vienna University of Technology, Austria
Domenico GRIMALDI, University of Calabria, Italy
Laszlo KISH, Texas A&M University, USA
Eduard LLOBET, Universitat Rovira i Virgili, Tarragona, Spain
Alex MASON, Liverpool John Moores University, The United Kingdom
Subhas MUKHOPADHYAY, Massey University, Palmerston North, New Zealand
Janusz MROCZKA, Wrocław University of Technology, Poland
Antoni ROGALSKI, Military University of Technology, Poland
Wiesław WOLIŃSKI, Warsaw University of Technology, Poland

Associate Editors
Zbigniew BIELECKI, Military University of Technology, Poland
Vladimir DIMCHEV, Ss. Cyril and Methodius University, Macedonia
Krzysztof DUDA, AGH University of Science and Technology, Poland
Janusz GAJDA, AGH University of Science and Technology, Poland
Teodor GOTSZALK, Wrocław University of Technology, Poland
Ireneusz JABŁOŃSKI, Wrocław University of Technology, Poland
Piotr JASIŃSKI, Gdańsk University of Technology, Poland
Piotr KISAŁA, Lublin University of Technology, Poland
Manoj KUMAR, University of Hyderabad, Telangana, India
Grzegorz LENTKA, Gdańsk University of Technology, Poland
Czesław ŁUKIANOWICZ, Koszalin University of Technology, Poland
Rosario MORELLO, University Mediterranean of Reggio Calabria, Italy
Fernando PUENTE LEÓN, University Karlsruhe, Germany
Petr SEDLAK, Brno University of Technology, Czech Republic
Hamid M. SEDIGHI, Shahid Chamran University of Ahvaz, Ahvaz, Iran
Roman SZEWCZYK, Warsaw University of Technology, Poland

Language Editors
Andrzej Stankiewicz, Gdansk University of Technology, Poland

Technical Editors
Agnieszka Kondratowicz, Gdansk University of Technology, Poland

Editorial Office of Metrology and Measurement Systems
tel.: (0-58) 347-1357

Bogumiła Zuga 32A Str.
01-811 Warsaw, Poland
T: +48 22 701 50 15

Please submit your manuscripts to Metrology and Measurement Systems via Internet Editorial System, accessible at

Journal Information

IMPACT FACTOR 2016: 1.598

CiteScore 2016: 1.58

SCImago Journal Rank (SJR) 2016: 0.460
Source Normalized Impact per Paper (SNIP) 2016: 1.228

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