Development of Mathematical Models for Detecting Micron Scale Volumetric Defects in Thin Film Coatings

G. Gaigals 1 , M. Donerblics 1 , and G. Dreifogels 1
  • 1 Ventspils University College, 101 Inženieru Str., Ventspils, LV-3601, LATVIA


The focus of the present research is to investigate possibilities of volumetric defect detection in thin film coatings on glass substrates by means of high definition imaging with no complex optical systems, such as lenses, and to determine development and construction feasibility of a defectoscope employing the investigated methods. Numerical simulations were used to test the proposed methods. Three theoretical models providing various degrees of accuracy and feasibility were studied.

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