Non-Contact Measurement of the Thickness and Dielectric Parameters of Dielectric Plates and Shells

The paper describes a new approach for non-destructive testing of the structural and geometric parameters of dielectric objects using capacitance techniques. The novelty of this approach lies in the design of a capacitance sensor comprising an array of electrodes with changeable potential distribution on them during a measurement process. This makes solvable the problem of measuring independently three input parameters. To demonstrate the capabilities of the developed measurement algorithms, the case studies based on computer simulation have been carried out.